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Instrument for high throughput measurement of material physical properties of a plurality of samples

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Instrument for high throughput measurement of material physical properties of a plurality of samples. / Hajduk, Damian (Inventor); Carlson, Eric (Inventor); Freitag, Christopher (Inventor); Kolosov, Oleg (Inventor).

Patent No.: US 6679130 B2. Feb 28, 2002.

Research output: Patent

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Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor) ; Freitag, Christopher (Inventor) ; Kolosov, Oleg (Inventor). / Instrument for high throughput measurement of material physical properties of a plurality of samples. Patent No.: US 6679130 B2. Feb 28, 2002.

Bibtex

@misc{51dc9ee0b34c4e75b77bb44313faef15,
title = "Instrument for high throughput measurement of material physical properties of a plurality of samples",
abstract = "A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov",
year = "2002",
month = feb,
day = "28",
language = "English",
type = "Patent",
note = "US 6679130 B2; GO1D 1/16; GO1D 7/02; GO1N 3/00; GO1N 3/24; GO1M 7/00",

}

RIS

TY - PAT

T1 - Instrument for high throughput measurement of material physical properties of a plurality of samples

AU - Hajduk, Damian

AU - Carlson, Eric

AU - Freitag, Christopher

AU - Kolosov, Oleg

PY - 2002/2/28

Y1 - 2002/2/28

N2 - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.

AB - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US 6679130 B2

ER -