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Integrating testability into microsystems

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Integrating testability into microsystems. / Olbrich, T ; Richardson, A ; Vermeiren, W et al.
In: Microsystem Technologies, Vol. 3, No. 2, 02.1997, p. 72-79.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Olbrich, T, Richardson, A, Vermeiren, W & Straube, B 1997, 'Integrating testability into microsystems', Microsystem Technologies, vol. 3, no. 2, pp. 72-79. https://doi.org/10.1007/s005420050059

APA

Olbrich, T., Richardson, A., Vermeiren, W., & Straube, B. (1997). Integrating testability into microsystems. Microsystem Technologies, 3(2), 72-79. https://doi.org/10.1007/s005420050059

Vancouver

Olbrich T, Richardson A, Vermeiren W, Straube B. Integrating testability into microsystems. Microsystem Technologies. 1997 Feb;3(2):72-79. doi: 10.1007/s005420050059

Author

Olbrich, T ; Richardson, A ; Vermeiren, W et al. / Integrating testability into microsystems. In: Microsystem Technologies. 1997 ; Vol. 3, No. 2. pp. 72-79.

Bibtex

@article{fcd8f019c15746c1bef3ef92d1e3eb1d,
title = "Integrating testability into microsystems",
abstract = "The integration of sensors and actuators with microelectronics into either compact packages or onto a single silicon die is likely to be of major technological importance over the next decade. These systems are referred to as Microsystems or Micro-Electro-Mechanical-Systems (MEMS). One obstacle to mass-market introduction are difficulties with quality and reliability verification. This paper outlines the difficulties of testing microsystems, shows approaches of test generation and verification transferable from the mixed-signal Integrated-Circuit (IC) domain, and demonstrates an on-line test designed for bridge-type, micromachined accelerometer and pressure sensors [1].",
keywords = "ACCELEROMETER",
author = "T Olbrich and A Richardson and W Vermeiren and B Straube",
year = "1997",
month = feb,
doi = "10.1007/s005420050059",
language = "English",
volume = "3",
pages = "72--79",
journal = "Microsystem Technologies",
issn = "0946-7076",
publisher = "Springer Verlag",
number = "2",

}

RIS

TY - JOUR

T1 - Integrating testability into microsystems

AU - Olbrich, T

AU - Richardson, A

AU - Vermeiren, W

AU - Straube, B

PY - 1997/2

Y1 - 1997/2

N2 - The integration of sensors and actuators with microelectronics into either compact packages or onto a single silicon die is likely to be of major technological importance over the next decade. These systems are referred to as Microsystems or Micro-Electro-Mechanical-Systems (MEMS). One obstacle to mass-market introduction are difficulties with quality and reliability verification. This paper outlines the difficulties of testing microsystems, shows approaches of test generation and verification transferable from the mixed-signal Integrated-Circuit (IC) domain, and demonstrates an on-line test designed for bridge-type, micromachined accelerometer and pressure sensors [1].

AB - The integration of sensors and actuators with microelectronics into either compact packages or onto a single silicon die is likely to be of major technological importance over the next decade. These systems are referred to as Microsystems or Micro-Electro-Mechanical-Systems (MEMS). One obstacle to mass-market introduction are difficulties with quality and reliability verification. This paper outlines the difficulties of testing microsystems, shows approaches of test generation and verification transferable from the mixed-signal Integrated-Circuit (IC) domain, and demonstrates an on-line test designed for bridge-type, micromachined accelerometer and pressure sensors [1].

KW - ACCELEROMETER

U2 - 10.1007/s005420050059

DO - 10.1007/s005420050059

M3 - Journal article

VL - 3

SP - 72

EP - 79

JO - Microsystem Technologies

JF - Microsystem Technologies

SN - 0946-7076

IS - 2

ER -