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Interatomic force microscope and sample observing method therefor

Research output: Patent

Published

Standard

Interatomic force microscope and sample observing method therefor. / YAMANAKA, K (Inventor); Kolosov, Oleg (Inventor); OGISO, H (Inventor) et al.
Patent No.: JP2535759 (B2). Sept 18, 1996.

Research output: Patent

Harvard

YAMANAKA, K, Kolosov, O, OGISO, H, SATO, H & KODA, T Sept. 18 1996, Interatomic force microscope and sample observing method therefor, Patent No. JP2535759 (B2).

APA

YAMANAKA, K., Kolosov, O., OGISO, H., SATO, H., & KODA, T. (1996). Interatomic force microscope and sample observing method therefor. (Patent No. JP2535759 (B2)).

Vancouver

YAMANAKA K, Kolosov O, OGISO H, SATO H, KODA T, inventors. Interatomic force microscope and sample observing method therefor. JP2535759 (B2). 1996 Sept 18.

Author

YAMANAKA, K (Inventor) ; Kolosov, Oleg (Inventor) ; OGISO, H (Inventor) et al. / Interatomic force microscope and sample observing method therefor. Patent No.: JP2535759 (B2). Sept 18, 1996.

Bibtex

@misc{16893ec1ce2e4ad9b1ee359454a08950,
title = "Interatomic force microscope and sample observing method therefor",
abstract = "PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.",
keywords = "Atomic force microscopy, nonlinearity, nanomechanics, nanotechnology",
author = "K YAMANAKA and Oleg Kolosov and H OGISO and H SATO and T KODA",
year = "1996",
month = sep,
day = "18",
language = "English",
type = "Patent",
note = "JP2535759 (B2); G01B 11/30; G01B 21/30",

}

RIS

TY - PAT

T1 - Interatomic force microscope and sample observing method therefor

AU - YAMANAKA, K

AU - Kolosov, Oleg

AU - OGISO, H

AU - SATO, H

AU - KODA, T

PY - 1996/9/18

Y1 - 1996/9/18

N2 - PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

AB - PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

KW - Atomic force microscopy

KW - nonlinearity

KW - nanomechanics

KW - nanotechnology

M3 - Patent

M1 - JP2535759 (B2)

ER -