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Licence: CC BY: Creative Commons Attribution 4.0 International License
Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review
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TY - CONF
T1 - Local nano-mechanical properties in twisted double bi-layer graphene
AU - Canetta, Alessandra
AU - Spiece, Jean
AU - Gonzalez-Munoz, Sergio
AU - Nguyen , Viet-Hung
AU - de Crombrugghe , Pauline de Crombrugghe
AU - Agarwal, Khushboo
AU - Hong , Yuanzhuo
AU - Mohapatra , Sambit
AU - Ribeiro-Palau , Rebeca
AU - Charlier , Jean-Christophe
AU - Kolosov, Oleg
AU - Gehring, Pascal
PY - 2022/7/5
Y1 - 2022/7/5
N2 - Van der Waals heterostructures are tremendously versatile designer materials whose functionality can be engineered to an extend that goes far beyond the properties of the individual materials the heterostructure consists of [1]. In particular, by twisting two graphene layers, it is possible to induce an atomic reconstruction in the two-dimensional stack, which leads to a dramatic modification of the lattice symmetry [2]. This has important repercussions on its mechanical and electro-mechanical properties [3,4]. Here we investigate the local mechanical properties of double bi-layer graphene twisted by an angle ~1.1°. To this end, we employ three force microscope techniques, Piezoresponse Force Microscopy, Ultrasonic Force Microscopy and Electric Heterodyne Force Microscopy, respectively. We demonstrate that these methods are reliable and effective to visualize the Moiré pattern, to evidence the presence of strain solitons [5], and – for the first time – to extract the local Youngs modulus in such systems. Our results bring on a comprehensive study of such complex structures and unlock critical understanding of these materials.References[1] Geim, A., Grigorieva, I., Nature, 499 (2013) 419–425. [2] Dai, S., Xiang, Y., Srolovitz, D. J., Nano Lett., 16, 9 (2016) 5923–5927.[3] De Sanctis, A., Mehew, J. D., et al., Nano Lett., 18, 12 (2018) 7919–7926.[4] Li, Y., Wang, Xet al., Adv. Mater., 33 (2021) 2105879.[5] Alden, J. S., Tsen, A. W., et al., PNAS, 110 (2013) 11256–11260.
AB - Van der Waals heterostructures are tremendously versatile designer materials whose functionality can be engineered to an extend that goes far beyond the properties of the individual materials the heterostructure consists of [1]. In particular, by twisting two graphene layers, it is possible to induce an atomic reconstruction in the two-dimensional stack, which leads to a dramatic modification of the lattice symmetry [2]. This has important repercussions on its mechanical and electro-mechanical properties [3,4]. Here we investigate the local mechanical properties of double bi-layer graphene twisted by an angle ~1.1°. To this end, we employ three force microscope techniques, Piezoresponse Force Microscopy, Ultrasonic Force Microscopy and Electric Heterodyne Force Microscopy, respectively. We demonstrate that these methods are reliable and effective to visualize the Moiré pattern, to evidence the presence of strain solitons [5], and – for the first time – to extract the local Youngs modulus in such systems. Our results bring on a comprehensive study of such complex structures and unlock critical understanding of these materials.References[1] Geim, A., Grigorieva, I., Nature, 499 (2013) 419–425. [2] Dai, S., Xiang, Y., Srolovitz, D. J., Nano Lett., 16, 9 (2016) 5923–5927.[3] De Sanctis, A., Mehew, J. D., et al., Nano Lett., 18, 12 (2018) 7919–7926.[4] Li, Y., Wang, Xet al., Adv. Mater., 33 (2021) 2105879.[5] Alden, J. S., Tsen, A. W., et al., PNAS, 110 (2013) 11256–11260.
KW - SThM
KW - UFM
KW - E-HFM
KW - Ultrasonic force microscopy
KW - Heterodyne force micrscopy
KW - electrical heterodyne force microscopy
KW - 2D materials
KW - graphene
KW - bilayer graphene
KW - twisted graphene
KW - twistronics
KW - piezo force microscopy
KW - PFM
M3 - Abstract
T2 - Graphene 2022
Y2 - 5 July 2022 through 8 July 2022
ER -