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Local nano-mechanical properties in twisted double bi-layer graphene

Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

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Local nano-mechanical properties in twisted double bi-layer graphene. / Canetta, Alessandra ; Spiece, Jean; Gonzalez-Munoz, Sergio et al.
2022. Abstract from Graphene 2022, Aachen, Germany.

Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

Harvard

Canetta, A, Spiece, J, Gonzalez-Munoz, S, Nguyen , V-H, de Crombrugghe , PDC, Agarwal, K, Hong , Y, Mohapatra , S, Ribeiro-Palau , R, Charlier , J-C, Kolosov, O & Gehring, P 2022, 'Local nano-mechanical properties in twisted double bi-layer graphene', Graphene 2022, Aachen, Germany, 5/07/22 - 8/07/22. <https://phantomsfoundation.com/GRAPHENECONF/2022/Abstracts/Grapheneconf2022_Canetta_Alessandra_54.pdf>

APA

Canetta, A., Spiece, J., Gonzalez-Munoz, S., Nguyen , V.-H., de Crombrugghe , P. D. C., Agarwal, K., Hong , Y., Mohapatra , S., Ribeiro-Palau , R., Charlier , J.-C., Kolosov, O., & Gehring, P. (2022). Local nano-mechanical properties in twisted double bi-layer graphene. Abstract from Graphene 2022, Aachen, Germany. https://phantomsfoundation.com/GRAPHENECONF/2022/Abstracts/Grapheneconf2022_Canetta_Alessandra_54.pdf

Vancouver

Canetta A, Spiece J, Gonzalez-Munoz S, Nguyen VH, de Crombrugghe PDC, Agarwal K et al.. Local nano-mechanical properties in twisted double bi-layer graphene. 2022. Abstract from Graphene 2022, Aachen, Germany.

Author

Canetta, Alessandra ; Spiece, Jean ; Gonzalez-Munoz, Sergio et al. / Local nano-mechanical properties in twisted double bi-layer graphene. Abstract from Graphene 2022, Aachen, Germany.1 p.

Bibtex

@conference{fdcceb0bbb8f4f5c9e4a5db1256659ca,
title = "Local nano-mechanical properties in twisted double bi-layer graphene",
abstract = "Van der Waals heterostructures are tremendously versatile designer materials whose functionality can be engineered to an extend that goes far beyond the properties of the individual materials the heterostructure consists of [1]. In particular, by twisting two graphene layers, it is possible to induce an atomic reconstruction in the two-dimensional stack, which leads to a dramatic modification of the lattice symmetry [2]. This has important repercussions on its mechanical and electro-mechanical properties [3,4]. Here we investigate the local mechanical properties of double bi-layer graphene twisted by an angle ~1.1°. To this end, we employ three force microscope techniques, Piezoresponse Force Microscopy, Ultrasonic Force Microscopy and Electric Heterodyne Force Microscopy, respectively. We demonstrate that these methods are reliable and effective to visualize the Moir{\'e} pattern, to evidence the presence of strain solitons [5], and – for the first time – to extract the local Youngs modulus in such systems. Our results bring on a comprehensive study of such complex structures and unlock critical understanding of these materials.References[1] Geim, A., Grigorieva, I., Nature, 499 (2013) 419–425. [2] Dai, S., Xiang, Y., Srolovitz, D. J., Nano Lett., 16, 9 (2016) 5923–5927.[3] De Sanctis, A., Mehew, J. D., et al., Nano Lett., 18, 12 (2018) 7919–7926.[4] Li, Y., Wang, Xet al., Adv. Mater., 33 (2021) 2105879.[5] Alden, J. S., Tsen, A. W., et al., PNAS, 110 (2013) 11256–11260.",
keywords = "SThM, UFM, E-HFM, Ultrasonic force microscopy, Heterodyne force micrscopy, electrical heterodyne force microscopy, 2D materials, graphene, bilayer graphene, twisted graphene, twistronics, piezo force microscopy, PFM",
author = "Alessandra Canetta and Jean Spiece and Sergio Gonzalez-Munoz and Viet-Hung Nguyen and {de Crombrugghe}, {Pauline de Crombrugghe} and Khushboo Agarwal and Yuanzhuo Hong and Sambit Mohapatra and Rebeca Ribeiro-Palau and Jean-Christophe Charlier and Oleg Kolosov and Pascal Gehring",
year = "2022",
month = jul,
day = "5",
language = "English",
note = "Graphene 2022 ; Conference date: 05-07-2022 Through 08-07-2022",
url = "https://www.grapheneconf.com/2022/",

}

RIS

TY - CONF

T1 - Local nano-mechanical properties in twisted double bi-layer graphene

AU - Canetta, Alessandra

AU - Spiece, Jean

AU - Gonzalez-Munoz, Sergio

AU - Nguyen , Viet-Hung

AU - de Crombrugghe , Pauline de Crombrugghe

AU - Agarwal, Khushboo

AU - Hong , Yuanzhuo

AU - Mohapatra , Sambit

AU - Ribeiro-Palau , Rebeca

AU - Charlier , Jean-Christophe

AU - Kolosov, Oleg

AU - Gehring, Pascal

PY - 2022/7/5

Y1 - 2022/7/5

N2 - Van der Waals heterostructures are tremendously versatile designer materials whose functionality can be engineered to an extend that goes far beyond the properties of the individual materials the heterostructure consists of [1]. In particular, by twisting two graphene layers, it is possible to induce an atomic reconstruction in the two-dimensional stack, which leads to a dramatic modification of the lattice symmetry [2]. This has important repercussions on its mechanical and electro-mechanical properties [3,4]. Here we investigate the local mechanical properties of double bi-layer graphene twisted by an angle ~1.1°. To this end, we employ three force microscope techniques, Piezoresponse Force Microscopy, Ultrasonic Force Microscopy and Electric Heterodyne Force Microscopy, respectively. We demonstrate that these methods are reliable and effective to visualize the Moiré pattern, to evidence the presence of strain solitons [5], and – for the first time – to extract the local Youngs modulus in such systems. Our results bring on a comprehensive study of such complex structures and unlock critical understanding of these materials.References[1] Geim, A., Grigorieva, I., Nature, 499 (2013) 419–425. [2] Dai, S., Xiang, Y., Srolovitz, D. J., Nano Lett., 16, 9 (2016) 5923–5927.[3] De Sanctis, A., Mehew, J. D., et al., Nano Lett., 18, 12 (2018) 7919–7926.[4] Li, Y., Wang, Xet al., Adv. Mater., 33 (2021) 2105879.[5] Alden, J. S., Tsen, A. W., et al., PNAS, 110 (2013) 11256–11260.

AB - Van der Waals heterostructures are tremendously versatile designer materials whose functionality can be engineered to an extend that goes far beyond the properties of the individual materials the heterostructure consists of [1]. In particular, by twisting two graphene layers, it is possible to induce an atomic reconstruction in the two-dimensional stack, which leads to a dramatic modification of the lattice symmetry [2]. This has important repercussions on its mechanical and electro-mechanical properties [3,4]. Here we investigate the local mechanical properties of double bi-layer graphene twisted by an angle ~1.1°. To this end, we employ three force microscope techniques, Piezoresponse Force Microscopy, Ultrasonic Force Microscopy and Electric Heterodyne Force Microscopy, respectively. We demonstrate that these methods are reliable and effective to visualize the Moiré pattern, to evidence the presence of strain solitons [5], and – for the first time – to extract the local Youngs modulus in such systems. Our results bring on a comprehensive study of such complex structures and unlock critical understanding of these materials.References[1] Geim, A., Grigorieva, I., Nature, 499 (2013) 419–425. [2] Dai, S., Xiang, Y., Srolovitz, D. J., Nano Lett., 16, 9 (2016) 5923–5927.[3] De Sanctis, A., Mehew, J. D., et al., Nano Lett., 18, 12 (2018) 7919–7926.[4] Li, Y., Wang, Xet al., Adv. Mater., 33 (2021) 2105879.[5] Alden, J. S., Tsen, A. W., et al., PNAS, 110 (2013) 11256–11260.

KW - SThM

KW - UFM

KW - E-HFM

KW - Ultrasonic force microscopy

KW - Heterodyne force micrscopy

KW - electrical heterodyne force microscopy

KW - 2D materials

KW - graphene

KW - bilayer graphene

KW - twisted graphene

KW - twistronics

KW - piezo force microscopy

KW - PFM

M3 - Abstract

T2 - Graphene 2022

Y2 - 5 July 2022 through 8 July 2022

ER -