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Local probing of thermal properties at submicron depths with megahertz photothermal vibrations.

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Local probing of thermal properties at submicron depths with megahertz photothermal vibrations. / Kolosov, Oleg; Shiraishi, N.; Tomoda, M. et al.
In: Applied Physics Letters, Vol. 82, No. 4, 01.01.2003, p. 622-624.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Kolosov, O, Shiraishi, N, Tomoda, M & Wright, OB 2003, 'Local probing of thermal properties at submicron depths with megahertz photothermal vibrations.', Applied Physics Letters, vol. 82, no. 4, pp. 622-624. https://doi.org/10.1063/1.1539906

APA

Kolosov, O., Shiraishi, N., Tomoda, M., & Wright, O. B. (2003). Local probing of thermal properties at submicron depths with megahertz photothermal vibrations. Applied Physics Letters, 82(4), 622-624. https://doi.org/10.1063/1.1539906

Vancouver

Kolosov O, Shiraishi N, Tomoda M, Wright OB. Local probing of thermal properties at submicron depths with megahertz photothermal vibrations. Applied Physics Letters. 2003 Jan 1;82(4):622-624. doi: 10.1063/1.1539906

Author

Kolosov, Oleg ; Shiraishi, N. ; Tomoda, M. et al. / Local probing of thermal properties at submicron depths with megahertz photothermal vibrations. In: Applied Physics Letters. 2003 ; Vol. 82, No. 4. pp. 622-624.

Bibtex

@article{dd55cfc2221a468bac51dbecc3ed37e4,
title = "Local probing of thermal properties at submicron depths with megahertz photothermal vibrations.",
abstract = "We demonstrate the imaging of buried features in a microstructure—a tiny hole in an aluminum thin film covered by a chromium layer—with nanometer lateral resolution using a transient temperature distribution restricted to within ~0.5 µm of the sample surface. This is achieved by mapping photothermally induced megahertz surface vibrations in an atomic force microscope. Local thermal probing with megahertz-frequency thermal waves is thus shown to be a viable method for imaging subsurface thermal features at submicron depths. {\textcopyright}2003 American Institute of Physics.",
author = "Oleg Kolosov and N. Shiraishi and M. Tomoda and Wright, {O. B.}",
note = "Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 82 (4), 2003 and may be found athttp://link.aip.org/link/?APPLAB/82/622/1 Pioneering report on combination of scanned probe microscopy and optically excited phonons at MHz frequencies - opened the way for nanoscale subsurface thermal imaging, RAE_import_type : Journal article RAE_uoa_type : Physics",
year = "2003",
month = jan,
day = "1",
doi = "10.1063/1.1539906",
language = "English",
volume = "82",
pages = "622--624",
journal = "Applied Physics Letters",
issn = "1077-3118",
publisher = "American Institute of Physics Inc.",
number = "4",

}

RIS

TY - JOUR

T1 - Local probing of thermal properties at submicron depths with megahertz photothermal vibrations.

AU - Kolosov, Oleg

AU - Shiraishi, N.

AU - Tomoda, M.

AU - Wright, O. B.

N1 - Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 82 (4), 2003 and may be found athttp://link.aip.org/link/?APPLAB/82/622/1 Pioneering report on combination of scanned probe microscopy and optically excited phonons at MHz frequencies - opened the way for nanoscale subsurface thermal imaging, RAE_import_type : Journal article RAE_uoa_type : Physics

PY - 2003/1/1

Y1 - 2003/1/1

N2 - We demonstrate the imaging of buried features in a microstructure—a tiny hole in an aluminum thin film covered by a chromium layer—with nanometer lateral resolution using a transient temperature distribution restricted to within ~0.5 µm of the sample surface. This is achieved by mapping photothermally induced megahertz surface vibrations in an atomic force microscope. Local thermal probing with megahertz-frequency thermal waves is thus shown to be a viable method for imaging subsurface thermal features at submicron depths. ©2003 American Institute of Physics.

AB - We demonstrate the imaging of buried features in a microstructure—a tiny hole in an aluminum thin film covered by a chromium layer—with nanometer lateral resolution using a transient temperature distribution restricted to within ~0.5 µm of the sample surface. This is achieved by mapping photothermally induced megahertz surface vibrations in an atomic force microscope. Local thermal probing with megahertz-frequency thermal waves is thus shown to be a viable method for imaging subsurface thermal features at submicron depths. ©2003 American Institute of Physics.

U2 - 10.1063/1.1539906

DO - 10.1063/1.1539906

M3 - Journal article

VL - 82

SP - 622

EP - 624

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 1077-3118

IS - 4

ER -