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Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents

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Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents. / The ATLAS collaboration.
In: Journal of Instrumentation, Vol. 16, No. 8, P08025, 11.08.2021.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

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The ATLAS collaboration. Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents. Journal of Instrumentation. 2021 Aug 11;16(8):P08025. doi: 10.1088/1748-0221/16/08/P08025

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The ATLAS collaboration. / Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents. In: Journal of Instrumentation. 2021 ; Vol. 16, No. 8.

Bibtex

@article{52dedf3796894c1e85eb9a611dba94de,
title = "Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents",
abstract = "Non-ionizing energy loss causes bulk damage to the silicon sensors of the ATLAS pixel and strip detectors. This damage has important implications for data-taking operations, charged-particle track reconstruction, detector simulations, and physics analysis. This paper presents simulations and measurements of the leakage current in the ATLAS pixel detector and semiconductor tracker as a function of location in the detector and time, using data collected in Run 1 (2010–2012) and Run 2 (2015–2018) of the Large Hadron Collider. The extracted fluence shows a much stronger |z|-dependence in the innermost layers than is seen in simulation. Furthermore, the overall fluence on the second innermost layer is significantly higher than in simulation, with better agreement in layers at higher radii. These measurements are important for validating the simulation models and can be used in part to justify safety factors for future detector designs and interventions. {\textcopyright} 2021 CERN for the benefit of the ATLAS collaboration.",
keywords = "Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc), Radiation damage to detector materials (solid state), Charged particles, Energy dissipation, Microstrip devices, Pixels, Radiation damage, Safety factor, Silicon detectors, Atlas pixel detectors, Detector design, Detector simulations, Large Hadron Collider, Nonionizing energy loss, Physics analysis, Semiconductor tracker, Simulations and measurements, Leakage currents",
author = "{The ATLAS collaboration} and A.E. Barton and I.A. Bertram and G. Borissov and E.V. Bouhova-Thacker and H. Fox and R.C.W. Henderson and R.W.L. Jones and V. Kartvelishvili and R.E. Long and P.A. Love and D. Muenstermann and Izaac Sanderswood and M. Smizanska and A.S. Tee and J. Walder and A.M. Wharton and Melissa Yexley",
year = "2021",
month = aug,
day = "11",
doi = "10.1088/1748-0221/16/08/P08025",
language = "English",
volume = "16",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics Publishing",
number = "8",

}

RIS

TY - JOUR

T1 - Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents

AU - The ATLAS collaboration

AU - Barton, A.E.

AU - Bertram, I.A.

AU - Borissov, G.

AU - Bouhova-Thacker, E.V.

AU - Fox, H.

AU - Henderson, R.C.W.

AU - Jones, R.W.L.

AU - Kartvelishvili, V.

AU - Long, R.E.

AU - Love, P.A.

AU - Muenstermann, D.

AU - Sanderswood, Izaac

AU - Smizanska, M.

AU - Tee, A.S.

AU - Walder, J.

AU - Wharton, A.M.

AU - Yexley, Melissa

PY - 2021/8/11

Y1 - 2021/8/11

N2 - Non-ionizing energy loss causes bulk damage to the silicon sensors of the ATLAS pixel and strip detectors. This damage has important implications for data-taking operations, charged-particle track reconstruction, detector simulations, and physics analysis. This paper presents simulations and measurements of the leakage current in the ATLAS pixel detector and semiconductor tracker as a function of location in the detector and time, using data collected in Run 1 (2010–2012) and Run 2 (2015–2018) of the Large Hadron Collider. The extracted fluence shows a much stronger |z|-dependence in the innermost layers than is seen in simulation. Furthermore, the overall fluence on the second innermost layer is significantly higher than in simulation, with better agreement in layers at higher radii. These measurements are important for validating the simulation models and can be used in part to justify safety factors for future detector designs and interventions. © 2021 CERN for the benefit of the ATLAS collaboration.

AB - Non-ionizing energy loss causes bulk damage to the silicon sensors of the ATLAS pixel and strip detectors. This damage has important implications for data-taking operations, charged-particle track reconstruction, detector simulations, and physics analysis. This paper presents simulations and measurements of the leakage current in the ATLAS pixel detector and semiconductor tracker as a function of location in the detector and time, using data collected in Run 1 (2010–2012) and Run 2 (2015–2018) of the Large Hadron Collider. The extracted fluence shows a much stronger |z|-dependence in the innermost layers than is seen in simulation. Furthermore, the overall fluence on the second innermost layer is significantly higher than in simulation, with better agreement in layers at higher radii. These measurements are important for validating the simulation models and can be used in part to justify safety factors for future detector designs and interventions. © 2021 CERN for the benefit of the ATLAS collaboration.

KW - Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc)

KW - Radiation damage to detector materials (solid state)

KW - Charged particles

KW - Energy dissipation

KW - Microstrip devices

KW - Pixels

KW - Radiation damage

KW - Safety factor

KW - Silicon detectors

KW - Atlas pixel detectors

KW - Detector design

KW - Detector simulations

KW - Large Hadron Collider

KW - Nonionizing energy loss

KW - Physics analysis

KW - Semiconductor tracker

KW - Simulations and measurements

KW - Leakage currents

U2 - 10.1088/1748-0221/16/08/P08025

DO - 10.1088/1748-0221/16/08/P08025

M3 - Journal article

VL - 16

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

IS - 8

M1 - P08025

ER -