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    Rights statement: © ACM, 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis http://dx.doi.org/10.1145/2931037.2931039

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Mutation-aware fault prediction

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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Mutation-aware fault prediction. / Bowes, David; Hall, Tracy; Harman, Mark et al.
ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis. New York: Association for Computing Machinery, Inc, 2016. p. 330-341.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Bowes, D, Hall, T, Harman, M, Jia, Y, Sarro, F & Wu, F 2016, Mutation-aware fault prediction. in ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis. Association for Computing Machinery, Inc, New York, pp. 330-341, 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrucken, Germany, 18/07/16. https://doi.org/10.1145/2931037.2931039

APA

Bowes, D., Hall, T., Harman, M., Jia, Y., Sarro, F., & Wu, F. (2016). Mutation-aware fault prediction. In ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis (pp. 330-341). Association for Computing Machinery, Inc. https://doi.org/10.1145/2931037.2931039

Vancouver

Bowes D, Hall T, Harman M, Jia Y, Sarro F, Wu F. Mutation-aware fault prediction. In ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis. New York: Association for Computing Machinery, Inc. 2016. p. 330-341 doi: 10.1145/2931037.2931039

Author

Bowes, David ; Hall, Tracy ; Harman, Mark et al. / Mutation-aware fault prediction. ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis. New York : Association for Computing Machinery, Inc, 2016. pp. 330-341

Bibtex

@inproceedings{0832b691f19d4f8d8f9e7fefb72e3e3d,
title = "Mutation-aware fault prediction",
abstract = "We introduce mutation-aware fault prediction, which leverages additional guidance from metrics constructed in terms of mutants and the test cases that cover and detect them. We report the results of 12 sets of experiments, applying 4 Different predictive modelling techniques to 3 large real-world systems (both open and closed source). The results show that our proposal can significantly (p ≤ 0:05) improve fault prediction performance. Moreover, mutation-based metrics lie in the top 5% most frequently relied upon fault predictors in 10 of the 12 sets of experiments, and provide the majority of the top ten fault predictors in 9 of the 12 sets of experiments.",
keywords = "Empirical study, Mutation testing, Software defect prediction, Software fault prediction, Software metrics",
author = "David Bowes and Tracy Hall and Mark Harman and Yue Jia and Federica Sarro and Fan Wu",
note = "{\textcopyright} ACM, 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis http://dx.doi.org/10.1145/2931037.2931039; 25th International Symposium on Software Testing and Analysis, ISSTA 2016 ; Conference date: 18-07-2016 Through 20-07-2016",
year = "2016",
month = jul,
day = "18",
doi = "10.1145/2931037.2931039",
language = "English",
pages = "330--341",
booktitle = "ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis",
publisher = "Association for Computing Machinery, Inc",

}

RIS

TY - GEN

T1 - Mutation-aware fault prediction

AU - Bowes, David

AU - Hall, Tracy

AU - Harman, Mark

AU - Jia, Yue

AU - Sarro, Federica

AU - Wu, Fan

N1 - © ACM, 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis http://dx.doi.org/10.1145/2931037.2931039

PY - 2016/7/18

Y1 - 2016/7/18

N2 - We introduce mutation-aware fault prediction, which leverages additional guidance from metrics constructed in terms of mutants and the test cases that cover and detect them. We report the results of 12 sets of experiments, applying 4 Different predictive modelling techniques to 3 large real-world systems (both open and closed source). The results show that our proposal can significantly (p ≤ 0:05) improve fault prediction performance. Moreover, mutation-based metrics lie in the top 5% most frequently relied upon fault predictors in 10 of the 12 sets of experiments, and provide the majority of the top ten fault predictors in 9 of the 12 sets of experiments.

AB - We introduce mutation-aware fault prediction, which leverages additional guidance from metrics constructed in terms of mutants and the test cases that cover and detect them. We report the results of 12 sets of experiments, applying 4 Different predictive modelling techniques to 3 large real-world systems (both open and closed source). The results show that our proposal can significantly (p ≤ 0:05) improve fault prediction performance. Moreover, mutation-based metrics lie in the top 5% most frequently relied upon fault predictors in 10 of the 12 sets of experiments, and provide the majority of the top ten fault predictors in 9 of the 12 sets of experiments.

KW - Empirical study

KW - Mutation testing

KW - Software defect prediction

KW - Software fault prediction

KW - Software metrics

U2 - 10.1145/2931037.2931039

DO - 10.1145/2931037.2931039

M3 - Conference contribution/Paper

AN - SCOPUS:84984918495

SP - 330

EP - 341

BT - ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis

PB - Association for Computing Machinery, Inc

CY - New York

T2 - 25th International Symposium on Software Testing and Analysis, ISSTA 2016

Y2 - 18 July 2016 through 20 July 2016

ER -