Final published version, 659 KB, PDF document
Available under license: CC BY: Creative Commons Attribution 4.0 International License
Final published version
Licence: CC BY: Creative Commons Attribution 4.0 International License
Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review
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TY - CONF
T1 - Nano-mapping of Surface and Subsurface Physical Properties of 2D materials
AU - Kolosov, Oleg Victor
AU - Kay, Nicholas
AU - Spiece, Jean
AU - Alsharif, Ghazi
AU - Robinson, Benjamin James
AU - Dinelli, Franco
PY - 2016/6/25
Y1 - 2016/6/25
N2 - A massive interest in two-dimensional materials (2DM) triggered by graphene (GR) discovery1 is fueled by the unique electronic, mechanical and thermal properties of these few-atomic-layers-thick materials. While electronic properties of graphene and other 2DM’s such as MoS2, WS, Bi2Se3, were extensively studied, their mechanical and thermal properties, equally record-breaking, are much less explored, due to inadequate tools for nanoscale probing of physical properties of atomically thin layers.Here we overcome this by combining atomic force microscopy (AFM) with specialist nanomechanical, nanothermal and nanoelectrical probes. By applying these to the single and few layer Gr and MoS2 we were able to explore the nanomechanical interaction of 2DM’s andthe substrate, including layers adhesion and stresses; observe internal defects in the few layer 2DM’s, and defect movement under applied strain; map the nanoscale distribution, and quantify electrical charges trapped at the 2DM-substrate interface; observe with microscale and nanoscale resolution local electrical and thermal transport in these materials.
AB - A massive interest in two-dimensional materials (2DM) triggered by graphene (GR) discovery1 is fueled by the unique electronic, mechanical and thermal properties of these few-atomic-layers-thick materials. While electronic properties of graphene and other 2DM’s such as MoS2, WS, Bi2Se3, were extensively studied, their mechanical and thermal properties, equally record-breaking, are much less explored, due to inadequate tools for nanoscale probing of physical properties of atomically thin layers.Here we overcome this by combining atomic force microscopy (AFM) with specialist nanomechanical, nanothermal and nanoelectrical probes. By applying these to the single and few layer Gr and MoS2 we were able to explore the nanomechanical interaction of 2DM’s andthe substrate, including layers adhesion and stresses; observe internal defects in the few layer 2DM’s, and defect movement under applied strain; map the nanoscale distribution, and quantify electrical charges trapped at the 2DM-substrate interface; observe with microscale and nanoscale resolution local electrical and thermal transport in these materials.
KW - Graphene
KW - 2D materials
KW - SPM
KW - nanothermal
KW - ultrasonic force microscopy
KW - nanomechanics
KW - NEMS
KW - QEMS
M3 - Abstract
SP - 18
ER -