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Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes

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Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes. / D. Tovee, Peter; Pumarol, Manuel; C. Rosamond, Mark; Jones, Robert; C. Petty, Michael; A. Zeze, Dagou; V. Kolosov, Oleg.

In: Physical Chemistry Chemical Physics, Vol. 16, No. 3, 2014, p. 1174-1181.

Research output: Contribution to journalJournal articlepeer-review

Harvard

D. Tovee, P, Pumarol, M, C. Rosamond, M, Jones, R, C. Petty, M, A. Zeze, D & V. Kolosov, O 2014, 'Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes', Physical Chemistry Chemical Physics, vol. 16, no. 3, pp. 1174-1181. https://doi.org/10.1039/C3CP53047G

APA

D. Tovee, P., Pumarol, M., C. Rosamond, M., Jones, R., C. Petty, M., A. Zeze, D., & V. Kolosov, O. (2014). Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes. Physical Chemistry Chemical Physics, 16(3), 1174-1181. https://doi.org/10.1039/C3CP53047G

Vancouver

D. Tovee P, Pumarol M, C. Rosamond M, Jones R, C. Petty M, A. Zeze D et al. Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes. Physical Chemistry Chemical Physics. 2014;16(3):1174-1181. https://doi.org/10.1039/C3CP53047G

Author

D. Tovee, Peter ; Pumarol, Manuel ; C. Rosamond, Mark ; Jones, Robert ; C. Petty, Michael ; A. Zeze, Dagou ; V. Kolosov, Oleg. / Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes. In: Physical Chemistry Chemical Physics. 2014 ; Vol. 16, No. 3. pp. 1174-1181.

Bibtex

@article{4fd9ace1c6c14a878dd5f7ebb61f78fa,
title = "Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes",
abstract = "We present a new concept of scanning thermal nanoprobe that utilizes the extreme thermal conductance of a carbon nanotube (CNT) to channel heat between the probe and the sample. The integration of CNT in scanning thermal microscopy (SThM) overcomes the main drawbacks of standard SThM probes, where the low thermal conductance of the apex SThM probe is the main limiting factor. The integration of CNT (CNT- SThM) extends SThM sensitivity to thermal transport measurement in higher thermal conductivity materials such as metals, semiconductors and ceramics, while also improving the spatial resolution. Investigation of thermal transport in ultra large scale integration (ULSI) interconnects, using CNT- SThM probe, showed fine details of heat transport in ceramic layer, vital for mitigating electromigration in ULSI metallic current leads. For a few layer graphene, the heat transport sensitivity and spatial resolution of the CNT-SThM probe demonstrated significantly superior thermal resolution compared to that of standard SThM probes achieving 20-30 nm topography and ~30 nm thermal spatial resolution compared to 50-100 nm for standard SThM probes. The outstanding axial thermal conductivity, high aspect ratio and robustness of CNTs can make CNT-SThM the perfect thermal probe for the measurement of nanoscale thermophysical properties and an excellent candidate for the next generation of thermal microscopes.",
keywords = "cond-mat.mtrl-sci, cond-mat.mes-hall, AFM, SThM, scanning thermal microscopy, CNT, nanoscale heat transfer",
author = "{D. Tovee}, Peter and Manuel Pumarol and {C. Rosamond}, Mark and Robert Jones and {C. Petty}, Michael and {A. Zeze}, Dagou and {V. Kolosov}, Oleg",
note = "E-mail: o.kolosov@lancaster.ac.uk, http://www.nano-science.com",
year = "2014",
doi = "10.1039/C3CP53047G",
language = "English",
volume = "16",
pages = "1174--1181",
journal = "Physical Chemistry Chemical Physics",
issn = "1463-9076",
publisher = "Royal Society of Chemistry",
number = "3",

}

RIS

TY - JOUR

T1 - Nanoscale resolution scanning thermal microscopy using carbon nanotube tipped thermal probes

AU - D. Tovee, Peter

AU - Pumarol, Manuel

AU - C. Rosamond, Mark

AU - Jones, Robert

AU - C. Petty, Michael

AU - A. Zeze, Dagou

AU - V. Kolosov, Oleg

N1 - E-mail: o.kolosov@lancaster.ac.uk, http://www.nano-science.com

PY - 2014

Y1 - 2014

N2 - We present a new concept of scanning thermal nanoprobe that utilizes the extreme thermal conductance of a carbon nanotube (CNT) to channel heat between the probe and the sample. The integration of CNT in scanning thermal microscopy (SThM) overcomes the main drawbacks of standard SThM probes, where the low thermal conductance of the apex SThM probe is the main limiting factor. The integration of CNT (CNT- SThM) extends SThM sensitivity to thermal transport measurement in higher thermal conductivity materials such as metals, semiconductors and ceramics, while also improving the spatial resolution. Investigation of thermal transport in ultra large scale integration (ULSI) interconnects, using CNT- SThM probe, showed fine details of heat transport in ceramic layer, vital for mitigating electromigration in ULSI metallic current leads. For a few layer graphene, the heat transport sensitivity and spatial resolution of the CNT-SThM probe demonstrated significantly superior thermal resolution compared to that of standard SThM probes achieving 20-30 nm topography and ~30 nm thermal spatial resolution compared to 50-100 nm for standard SThM probes. The outstanding axial thermal conductivity, high aspect ratio and robustness of CNTs can make CNT-SThM the perfect thermal probe for the measurement of nanoscale thermophysical properties and an excellent candidate for the next generation of thermal microscopes.

AB - We present a new concept of scanning thermal nanoprobe that utilizes the extreme thermal conductance of a carbon nanotube (CNT) to channel heat between the probe and the sample. The integration of CNT in scanning thermal microscopy (SThM) overcomes the main drawbacks of standard SThM probes, where the low thermal conductance of the apex SThM probe is the main limiting factor. The integration of CNT (CNT- SThM) extends SThM sensitivity to thermal transport measurement in higher thermal conductivity materials such as metals, semiconductors and ceramics, while also improving the spatial resolution. Investigation of thermal transport in ultra large scale integration (ULSI) interconnects, using CNT- SThM probe, showed fine details of heat transport in ceramic layer, vital for mitigating electromigration in ULSI metallic current leads. For a few layer graphene, the heat transport sensitivity and spatial resolution of the CNT-SThM probe demonstrated significantly superior thermal resolution compared to that of standard SThM probes achieving 20-30 nm topography and ~30 nm thermal spatial resolution compared to 50-100 nm for standard SThM probes. The outstanding axial thermal conductivity, high aspect ratio and robustness of CNTs can make CNT-SThM the perfect thermal probe for the measurement of nanoscale thermophysical properties and an excellent candidate for the next generation of thermal microscopes.

KW - cond-mat.mtrl-sci

KW - cond-mat.mes-hall

KW - AFM

KW - SThM

KW - scanning thermal microscopy

KW - CNT

KW - nanoscale heat transfer

U2 - 10.1039/C3CP53047G

DO - 10.1039/C3CP53047G

M3 - Journal article

VL - 16

SP - 1174

EP - 1181

JO - Physical Chemistry Chemical Physics

JF - Physical Chemistry Chemical Physics

SN - 1463-9076

IS - 3

ER -