Rights statement: © 1994 The American Physical Society
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Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Optically induced density depletion of the two-dimensional electron system in GaAs/AlxGa1-xAs heterojunctions
AU - Hayne, Manus
AU - USHER, A
AU - PLAUT, A S
AU - PLOOG, K
N1 - © 1994 The American Physical Society
PY - 1994/12/15
Y1 - 1994/12/15
N2 - We report measurements of optically induced density depletion of the two-dimensional electron system formed at the interface of a GaAs/AlxGa1-xAs heterojunction with a δ-doped layer of Be acceptors in the GaAs 250 Å from the interface. Our measurements show that at low laser power the depletion effect is controlled by the recombination of two-dimensional electrons with photoexcited holes that have become bound to the Be acceptors. The point at which all the Be acceptors in the sample have been neutralized by photoexcited holes is indicated by the sudden appearance of free holes in the GaAs, which then control the density depletion in the high-power regime. We present a comprehensive dynamic model of the depletion effect that includes both regimes, and calculate the densities and mobilities of the carriers involved in the process.
AB - We report measurements of optically induced density depletion of the two-dimensional electron system formed at the interface of a GaAs/AlxGa1-xAs heterojunction with a δ-doped layer of Be acceptors in the GaAs 250 Å from the interface. Our measurements show that at low laser power the depletion effect is controlled by the recombination of two-dimensional electrons with photoexcited holes that have become bound to the Be acceptors. The point at which all the Be acceptors in the sample have been neutralized by photoexcited holes is indicated by the sudden appearance of free holes in the GaAs, which then control the density depletion in the high-power regime. We present a comprehensive dynamic model of the depletion effect that includes both regimes, and calculate the densities and mobilities of the carriers involved in the process.
U2 - 10.1103/PhysRevB.50.17208
DO - 10.1103/PhysRevB.50.17208
M3 - Journal article
VL - 50
SP - 17208
EP - 17216
JO - Physical review B
JF - Physical review B
SN - 0163-1829
IS - 23
ER -