Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
}
TY - CHAP
T1 - Physical Mapping and Performance Study of a Multi-Clock 3-Dimensional Network-on-Chip Mesh.
AU - Grange, M.
AU - Weldezion, A. Y.
AU - Pamunuwa, Dinesh Bandara
AU - Weerasekera, R.
AU - Zhonghai, Lu
AU - Jantsch, A.
AU - Shippen, D.
PY - 2009
Y1 - 2009
N2 - The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employing through silicon vias (TSV) for vertical connectivity is investigated with a cycle-accurate RTL simulator. The physical latency and area impact of TSVs, switches, and the on-chip interconnect is evaluated to extract the maximum signaling speeds through the switches, horizontal and vertical network links. The relatively low parasitics of TSVs compared to the on-chip 2-D interconnect allow for higher signaling speeds between chip layers. The system-level impact on overall network performance as a result of clocking vertical packets at a higher rate through the TSV interconnect is simulated and reported.
AB - The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employing through silicon vias (TSV) for vertical connectivity is investigated with a cycle-accurate RTL simulator. The physical latency and area impact of TSVs, switches, and the on-chip interconnect is evaluated to extract the maximum signaling speeds through the switches, horizontal and vertical network links. The relatively low parasitics of TSVs compared to the on-chip 2-D interconnect allow for higher signaling speeds between chip layers. The system-level impact on overall network performance as a result of clocking vertical packets at a higher rate through the TSV interconnect is simulated and reported.
U2 - 10.1109/3DIC.2009.5306540
DO - 10.1109/3DIC.2009.5306540
M3 - Chapter
SN - 978-1-4244-4511-0
BT - Proceedings of the IEEE International Conference on 3D System Integration (3D IC), 2009
PB - IEEE
CY - San Francisco
ER -