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Printed circuit board as a MEMS platform for focused ion beam technology

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Printed circuit board as a MEMS platform for focused ion beam technology. / Cheneler, D.; Teng, J.; Adams, M. et al.
In: Microelectronic Engineering, Vol. 88, No. 1, 01.2011, p. 121-126.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Cheneler, D, Teng, J, Adams, M, Anthony, CJ, Carter, EL & Ward, M 2011, 'Printed circuit board as a MEMS platform for focused ion beam technology', Microelectronic Engineering, vol. 88, no. 1, pp. 121-126. https://doi.org/10.1016/j.mee.2010.09.017

APA

Cheneler, D., Teng, J., Adams, M., Anthony, C. J., Carter, E. L., & Ward, M. (2011). Printed circuit board as a MEMS platform for focused ion beam technology. Microelectronic Engineering, 88(1), 121-126. https://doi.org/10.1016/j.mee.2010.09.017

Vancouver

Cheneler D, Teng J, Adams M, Anthony CJ, Carter EL, Ward M. Printed circuit board as a MEMS platform for focused ion beam technology. Microelectronic Engineering. 2011 Jan;88(1):121-126. doi: 10.1016/j.mee.2010.09.017

Author

Cheneler, D. ; Teng, J. ; Adams, M. et al. / Printed circuit board as a MEMS platform for focused ion beam technology. In: Microelectronic Engineering. 2011 ; Vol. 88, No. 1. pp. 121-126.

Bibtex

@article{9d2f38fc65444dc39ae3c7756c2b17ac,
title = "Printed circuit board as a MEMS platform for focused ion beam technology",
abstract = "By combining low-cost printed circuit board technology and focused ion beam techniques, a simple method has been developed to produce thermal microsensors in a robust package with straightforward electrical connectivity. Two devices have been developed to demonstrate the principle. The first was fabricated using a single step process comprised of FIB deposited platinum. The second device utilised a multistep process using FIB milled thermally evaporated Au on a PCB platform with through-plated vias. The performance of these devices was tested by measuring their thermo-electrical characteristics.",
keywords = "Focused ion beam, Printed circuit board, Thermal sensor",
author = "D. Cheneler and J. Teng and M. Adams and Anthony, {C. J.} and Carter, {E. L.} and M. Ward",
year = "2011",
month = jan,
doi = "10.1016/j.mee.2010.09.017",
language = "English",
volume = "88",
pages = "121--126",
journal = "Microelectronic Engineering",
issn = "0167-9317",
publisher = "Elsevier",
number = "1",

}

RIS

TY - JOUR

T1 - Printed circuit board as a MEMS platform for focused ion beam technology

AU - Cheneler, D.

AU - Teng, J.

AU - Adams, M.

AU - Anthony, C. J.

AU - Carter, E. L.

AU - Ward, M.

PY - 2011/1

Y1 - 2011/1

N2 - By combining low-cost printed circuit board technology and focused ion beam techniques, a simple method has been developed to produce thermal microsensors in a robust package with straightforward electrical connectivity. Two devices have been developed to demonstrate the principle. The first was fabricated using a single step process comprised of FIB deposited platinum. The second device utilised a multistep process using FIB milled thermally evaporated Au on a PCB platform with through-plated vias. The performance of these devices was tested by measuring their thermo-electrical characteristics.

AB - By combining low-cost printed circuit board technology and focused ion beam techniques, a simple method has been developed to produce thermal microsensors in a robust package with straightforward electrical connectivity. Two devices have been developed to demonstrate the principle. The first was fabricated using a single step process comprised of FIB deposited platinum. The second device utilised a multistep process using FIB milled thermally evaporated Au on a PCB platform with through-plated vias. The performance of these devices was tested by measuring their thermo-electrical characteristics.

KW - Focused ion beam

KW - Printed circuit board

KW - Thermal sensor

U2 - 10.1016/j.mee.2010.09.017

DO - 10.1016/j.mee.2010.09.017

M3 - Journal article

VL - 88

SP - 121

EP - 126

JO - Microelectronic Engineering

JF - Microelectronic Engineering

SN - 0167-9317

IS - 1

ER -