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Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.

Research output: Contribution to Journal/MagazineJournal article

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Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters. / Benson, Chris; Price, Robert A.; Silvie, Jon et al.
In: Physics in Medicine and Biology, Vol. 49, No. 14, 28.06.2004, p. 3145-3159.

Research output: Contribution to Journal/MagazineJournal article

Harvard

Benson, C, Price, RA, Silvie, J, Jaksic, A & Joyce, MJ 2004, 'Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.', Physics in Medicine and Biology, vol. 49, no. 14, pp. 3145-3159. https://doi.org/10.1088/0031-9155/49/14/009

APA

Benson, C., Price, R. A., Silvie, J., Jaksic, A., & Joyce, M. J. (2004). Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters. Physics in Medicine and Biology, 49(14), 3145-3159. https://doi.org/10.1088/0031-9155/49/14/009

Vancouver

Benson C, Price RA, Silvie J, Jaksic A, Joyce MJ. Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters. Physics in Medicine and Biology. 2004 Jun 28;49(14):3145-3159. doi: 10.1088/0031-9155/49/14/009

Author

Benson, Chris ; Price, Robert A. ; Silvie, Jon et al. / Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters. In: Physics in Medicine and Biology. 2004 ; Vol. 49, No. 14. pp. 3145-3159.

Bibtex

@article{3b7b9a91171b4a0891e235ec8b0cf6fa,
title = "Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.",
abstract = "The results of a recent study on the limiting uncertainties in the measurement of photon radiation dose with MOSFET dosimeters are reported. The statistical uncertainty in dose measurement from a single device has been measured before and after irradiation. The resulting increase in 1/f noise with radiation dose has been investigated via various analytical models. The limit of uncertainty in the ubiquitous linear trend of threshold voltage with dose has been measured and compared to two nonlinear models. Inter-device uncertainty has been investigated in a group of 40 devices, and preliminary evidence for kurtosis and skewness in the distributions for devices without external bias has been observed.",
author = "Chris Benson and Price, {Robert A.} and Jon Silvie and Aleksandar Jaksic and Joyce, {Malcolm J.}",
year = "2004",
month = jun,
day = "28",
doi = "10.1088/0031-9155/49/14/009",
language = "English",
volume = "49",
pages = "3145--3159",
journal = "Physics in Medicine and Biology",
issn = "1361-6560",
publisher = "IOP Publishing Ltd.",
number = "14",

}

RIS

TY - JOUR

T1 - Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters.

AU - Benson, Chris

AU - Price, Robert A.

AU - Silvie, Jon

AU - Jaksic, Aleksandar

AU - Joyce, Malcolm J.

PY - 2004/6/28

Y1 - 2004/6/28

N2 - The results of a recent study on the limiting uncertainties in the measurement of photon radiation dose with MOSFET dosimeters are reported. The statistical uncertainty in dose measurement from a single device has been measured before and after irradiation. The resulting increase in 1/f noise with radiation dose has been investigated via various analytical models. The limit of uncertainty in the ubiquitous linear trend of threshold voltage with dose has been measured and compared to two nonlinear models. Inter-device uncertainty has been investigated in a group of 40 devices, and preliminary evidence for kurtosis and skewness in the distributions for devices without external bias has been observed.

AB - The results of a recent study on the limiting uncertainties in the measurement of photon radiation dose with MOSFET dosimeters are reported. The statistical uncertainty in dose measurement from a single device has been measured before and after irradiation. The resulting increase in 1/f noise with radiation dose has been investigated via various analytical models. The limit of uncertainty in the ubiquitous linear trend of threshold voltage with dose has been measured and compared to two nonlinear models. Inter-device uncertainty has been investigated in a group of 40 devices, and preliminary evidence for kurtosis and skewness in the distributions for devices without external bias has been observed.

U2 - 10.1088/0031-9155/49/14/009

DO - 10.1088/0031-9155/49/14/009

M3 - Journal article

VL - 49

SP - 3145

EP - 3159

JO - Physics in Medicine and Biology

JF - Physics in Medicine and Biology

SN - 1361-6560

IS - 14

ER -