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RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades

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RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades. / The RD53 collaboration.
In: Journal of Instrumentation, Vol. 20, No. 03, P03024, 31.03.2025.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

The RD53 collaboration 2025, 'RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades', Journal of Instrumentation, vol. 20, no. 03, P03024. https://doi.org/10.1088/1748-0221/20/03/p03024

APA

The RD53 collaboration (2025). RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades. Journal of Instrumentation, 20(03), Article P03024. https://doi.org/10.1088/1748-0221/20/03/p03024

Vancouver

The RD53 collaboration. RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades. Journal of Instrumentation. 2025 Mar 31;20(03):P03024. Epub 2025 Feb 19. doi: 10.1088/1748-0221/20/03/p03024

Author

The RD53 collaboration. / RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades. In: Journal of Instrumentation. 2025 ; Vol. 20, No. 03.

Bibtex

@article{5d6466865f9145279839448702c4d3f5,
title = "RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades",
abstract = "The RD53 collaboration has since 2013 developed new hybrid pixel detector chips with 50 × 50 μm2 pixels for the HL-LHC upgrades of the ATLAS and CMS experiments at CERN. A common architecture, design and verification framework has been developed to enable final pixel chips of different sizes to be designed, verified and tested to handle extreme hit rates of 3 GHz/cm2 (up to 12 GHz per chip) together with an increased trigger rate of 1 MHz and efficient readout of up to 5.12 Gbits/s per pixel chip. Tolerance to an extremely hostile radiation environment with 1 Grad over 10 years and induced SEU (Single Event Upset) rates of up to 100 upsets per second per chip have been major challenges to make reliable pixel chips. Three generations of pixel chips, and many specific mixed signal building blocks and radiation test chips, have been submitted and extensively tested to get to final production chips. The large, complex and high rate pixel chips have been developed with a strong emphasis on low power consumption together with a concurrent development and qualification of novel serial powering at chip, module and system level, to minimize detector material budget.",
keywords = "Radiation-hard electronics, VLSI circuits, Particle tracking detectors (Solid-state detectors), Front-end electronics for detector readout",
author = "{The RD53 collaboration} and G. Alimonti and A. Andreazza and F. Arteche and M.B. Barbero and P. Barrillon and R. Beccherle and G. Bonomelli and G.M. Bilei and W. Bialas and D. Bortoletto and G. Calderini and A. Caratelli and A. Cassese and J. Christiansen and E. Conti and F. Crescioli and M. Daas and L. Damenti and S. D'Auria and {De Canio}, F. and {De Robertis}, G. and N. Demaria and J. DeWitt and Y. Dieter and A. Dimitrievska and W. Erdmann and S. Esposito and D. Exarchou and D. Fougeron and L. Gaioni and M. Garcia-Sciveres and D. Gnani and {Gozalez Renteria}, C. and M. Grippo and A. Guardino and M. Hamer and T. Heim and T. Hemperek and F. Hinterkeuser and S. Huiberts and {Jara Casas}, L.M. and J.J. John and J. Kampk{\"o}tter and M. Karagounis and I. Kazas and Y. Khwaira and R. Kluit and D. Koukola and Lingxin Meng and E. Thompson",
year = "2025",
month = mar,
day = "31",
doi = "10.1088/1748-0221/20/03/p03024",
language = "English",
volume = "20",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics Publishing",
number = "03",

}

RIS

TY - JOUR

T1 - RD53 pixel readout integrated circuits for ATLAS and CMS HL-LHC upgrades

AU - The RD53 collaboration

AU - Alimonti, G.

AU - Andreazza, A.

AU - Arteche, F.

AU - Barbero, M.B.

AU - Barrillon, P.

AU - Beccherle, R.

AU - Bonomelli, G.

AU - Bilei, G.M.

AU - Bialas, W.

AU - Bortoletto, D.

AU - Calderini, G.

AU - Caratelli, A.

AU - Cassese, A.

AU - Christiansen, J.

AU - Conti, E.

AU - Crescioli, F.

AU - Daas, M.

AU - Damenti, L.

AU - D'Auria, S.

AU - De Canio, F.

AU - De Robertis, G.

AU - Demaria, N.

AU - DeWitt, J.

AU - Dieter, Y.

AU - Dimitrievska, A.

AU - Erdmann, W.

AU - Esposito, S.

AU - Exarchou, D.

AU - Fougeron, D.

AU - Gaioni, L.

AU - Garcia-Sciveres, M.

AU - Gnani, D.

AU - Gozalez Renteria, C.

AU - Grippo, M.

AU - Guardino, A.

AU - Hamer, M.

AU - Heim, T.

AU - Hemperek, T.

AU - Hinterkeuser, F.

AU - Huiberts, S.

AU - Jara Casas, L.M.

AU - John, J.J.

AU - Kampkötter, J.

AU - Karagounis, M.

AU - Kazas, I.

AU - Khwaira, Y.

AU - Kluit, R.

AU - Koukola, D.

AU - Meng, Lingxin

AU - Thompson, E.

PY - 2025/3/31

Y1 - 2025/3/31

N2 - The RD53 collaboration has since 2013 developed new hybrid pixel detector chips with 50 × 50 μm2 pixels for the HL-LHC upgrades of the ATLAS and CMS experiments at CERN. A common architecture, design and verification framework has been developed to enable final pixel chips of different sizes to be designed, verified and tested to handle extreme hit rates of 3 GHz/cm2 (up to 12 GHz per chip) together with an increased trigger rate of 1 MHz and efficient readout of up to 5.12 Gbits/s per pixel chip. Tolerance to an extremely hostile radiation environment with 1 Grad over 10 years and induced SEU (Single Event Upset) rates of up to 100 upsets per second per chip have been major challenges to make reliable pixel chips. Three generations of pixel chips, and many specific mixed signal building blocks and radiation test chips, have been submitted and extensively tested to get to final production chips. The large, complex and high rate pixel chips have been developed with a strong emphasis on low power consumption together with a concurrent development and qualification of novel serial powering at chip, module and system level, to minimize detector material budget.

AB - The RD53 collaboration has since 2013 developed new hybrid pixel detector chips with 50 × 50 μm2 pixels for the HL-LHC upgrades of the ATLAS and CMS experiments at CERN. A common architecture, design and verification framework has been developed to enable final pixel chips of different sizes to be designed, verified and tested to handle extreme hit rates of 3 GHz/cm2 (up to 12 GHz per chip) together with an increased trigger rate of 1 MHz and efficient readout of up to 5.12 Gbits/s per pixel chip. Tolerance to an extremely hostile radiation environment with 1 Grad over 10 years and induced SEU (Single Event Upset) rates of up to 100 upsets per second per chip have been major challenges to make reliable pixel chips. Three generations of pixel chips, and many specific mixed signal building blocks and radiation test chips, have been submitted and extensively tested to get to final production chips. The large, complex and high rate pixel chips have been developed with a strong emphasis on low power consumption together with a concurrent development and qualification of novel serial powering at chip, module and system level, to minimize detector material budget.

KW - Radiation-hard electronics

KW - VLSI circuits

KW - Particle tracking detectors (Solid-state detectors)

KW - Front-end electronics for detector readout

U2 - 10.1088/1748-0221/20/03/p03024

DO - 10.1088/1748-0221/20/03/p03024

M3 - Journal article

VL - 20

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

IS - 03

M1 - P03024

ER -