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Scanning probe spectroscopy of ws2/graphene van der waals heterostructures

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Scanning probe spectroscopy of ws2/graphene van der waals heterostructures. / Dinelli, F.; Fabbri, F.; Forti, S. et al.
In: Nanomaterials, Vol. 10, No. 12, 11.12.2020, p. 1-11.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Dinelli, F, Fabbri, F, Forti, S, Coletti, C, Kolosov, OV & Pingue, P 2020, 'Scanning probe spectroscopy of ws2/graphene van der waals heterostructures', Nanomaterials, vol. 10, no. 12, pp. 1-11. https://doi.org/10.3390/nano10122494

APA

Dinelli, F., Fabbri, F., Forti, S., Coletti, C., Kolosov, O. V., & Pingue, P. (2020). Scanning probe spectroscopy of ws2/graphene van der waals heterostructures. Nanomaterials, 10(12), 1-11. https://doi.org/10.3390/nano10122494

Vancouver

Dinelli F, Fabbri F, Forti S, Coletti C, Kolosov OV, Pingue P. Scanning probe spectroscopy of ws2/graphene van der waals heterostructures. Nanomaterials. 2020 Dec 11;10(12):1-11. doi: 10.3390/nano10122494

Author

Dinelli, F. ; Fabbri, F. ; Forti, S. et al. / Scanning probe spectroscopy of ws2/graphene van der waals heterostructures. In: Nanomaterials. 2020 ; Vol. 10, No. 12. pp. 1-11.

Bibtex

@article{c92a67ebe82c40b3bf867041b9612eb0,
title = "Scanning probe spectroscopy of ws2/graphene van der waals heterostructures",
abstract = "In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning probe microscopy (SPM), operating in peak force–quantitative nano mechanical (PF-QNM), ultrasonic force microscopy (UFM) and electrostatic force microscopy (EFM) modes. This comparative approach provides a wealth of useful complementary information and allows one to cross-analyze on the nanoscale the morphological, mechanical, and electrostatic properties of the 2D heterostructures analyzed. Herein, we show that PF-QNM can accurately map surface properties, such as morphology and adhesion, and that UFM is exceptionally sensitive to a broader range of elastic properties, helping to uncover subsurface features located at the buried interfaces. All these data can be correlated with the local electrostatic properties obtained via EFM mapping of the surface potential, through the cantilever response at the first harmonic, and the dielectric permittivity, through the cantilever response at the second harmonic. In conclusion, we show that combining multi-parametric SPM with SEM and µRaman spectroscopy helps to identify single features of the WS2/Graphene/SiC heterostructures analyzed, demonstrating that this is a powerful tool-set for the investigation of 2D materials stacks, a building block for new advanced nano-devices. ",
keywords = "2DM, EFM, Epitaxial graphene, PF-QNM, SiC, Tungsten disulfide, UFM",
author = "F. Dinelli and F. Fabbri and S. Forti and C. Coletti and O.V. Kolosov and P. Pingue",
year = "2020",
month = dec,
day = "11",
doi = "10.3390/nano10122494",
language = "English",
volume = "10",
pages = "1--11",
journal = "Nanomaterials",
issn = "2079-4991",
publisher = "MDPI AG",
number = "12",

}

RIS

TY - JOUR

T1 - Scanning probe spectroscopy of ws2/graphene van der waals heterostructures

AU - Dinelli, F.

AU - Fabbri, F.

AU - Forti, S.

AU - Coletti, C.

AU - Kolosov, O.V.

AU - Pingue, P.

PY - 2020/12/11

Y1 - 2020/12/11

N2 - In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning probe microscopy (SPM), operating in peak force–quantitative nano mechanical (PF-QNM), ultrasonic force microscopy (UFM) and electrostatic force microscopy (EFM) modes. This comparative approach provides a wealth of useful complementary information and allows one to cross-analyze on the nanoscale the morphological, mechanical, and electrostatic properties of the 2D heterostructures analyzed. Herein, we show that PF-QNM can accurately map surface properties, such as morphology and adhesion, and that UFM is exceptionally sensitive to a broader range of elastic properties, helping to uncover subsurface features located at the buried interfaces. All these data can be correlated with the local electrostatic properties obtained via EFM mapping of the surface potential, through the cantilever response at the first harmonic, and the dielectric permittivity, through the cantilever response at the second harmonic. In conclusion, we show that combining multi-parametric SPM with SEM and µRaman spectroscopy helps to identify single features of the WS2/Graphene/SiC heterostructures analyzed, demonstrating that this is a powerful tool-set for the investigation of 2D materials stacks, a building block for new advanced nano-devices.

AB - In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning probe microscopy (SPM), operating in peak force–quantitative nano mechanical (PF-QNM), ultrasonic force microscopy (UFM) and electrostatic force microscopy (EFM) modes. This comparative approach provides a wealth of useful complementary information and allows one to cross-analyze on the nanoscale the morphological, mechanical, and electrostatic properties of the 2D heterostructures analyzed. Herein, we show that PF-QNM can accurately map surface properties, such as morphology and adhesion, and that UFM is exceptionally sensitive to a broader range of elastic properties, helping to uncover subsurface features located at the buried interfaces. All these data can be correlated with the local electrostatic properties obtained via EFM mapping of the surface potential, through the cantilever response at the first harmonic, and the dielectric permittivity, through the cantilever response at the second harmonic. In conclusion, we show that combining multi-parametric SPM with SEM and µRaman spectroscopy helps to identify single features of the WS2/Graphene/SiC heterostructures analyzed, demonstrating that this is a powerful tool-set for the investigation of 2D materials stacks, a building block for new advanced nano-devices.

KW - 2DM

KW - EFM

KW - Epitaxial graphene

KW - PF-QNM

KW - SiC

KW - Tungsten disulfide

KW - UFM

U2 - 10.3390/nano10122494

DO - 10.3390/nano10122494

M3 - Journal article

VL - 10

SP - 1

EP - 11

JO - Nanomaterials

JF - Nanomaterials

SN - 2079-4991

IS - 12

ER -