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Mathematics and Statistics

Links

https://www.tandfonline.com/doi/abs/10.1198/00401700152404327
Final published version

Text available via DOI:

https://doi.org/10.1198/00401700152404327
Final published version

Keywords

Case-control data, Empirical likelihood, Exponential tilt, Logistic regression, Reference distribution, Smooth goodness of fit

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Semiparametric approach to the one-way layout

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Published

K. Fokianos
J. Qin
B. Kedem
D.A. Short

<mark>Journal publication date</mark>	2001
<mark>Journal</mark>	Technometrics
Issue number	1
Volume	43
Number of pages	10
Pages (from-to)	56-65
Publication Status	Published
<mark>Original language</mark>	English