TY - CONF

T1 - SThM of 2D materials

T2 - EMRS - Spring Meeting

AU - Spiece, Jean

AU - Robinson, Benjamin James

AU - Kolosov, Oleg Victor

PY - 2015/5

Y1 - 2015/5

N2 - Measurement of thermal properties at the nanoscale presents a number if unique challenges. Here we report the exploration of the thermal properties of a range of 2D materials crossing scanning thermal microscopy (SThM) results with finite elements (FE) simulations. The materials length scale was incremented from ca. 0.3nm (monolayer) to bulk on graphene and MoS2.SThM is a modification of the more well-known Atomic Force Microscope (AFM) employing a self-heated probe which is brought into contact with the sample correspondingly causing a drop in the probe temperature which can be electronically monitored and interpreted to understand the samples thermal properties. FE simulations were performed by COMSOL software which allows to model and predicts properties of our systems varying graphene isotropy and anisoptropy as well as substrate interactions. We have investigated how these properties change as a function of sample thickness on substrates of both high and low thermal conductivities. We observe well defined values of thermal conductance for monolayer and near monolayer thicknesses, however some materials show increased conductance at increasing multilayers whilst others show a decrease – in most cases the conductance does not scale simply with thickness. We discuss and compare experimental considerations and simulation outputs in order to construct a possible thermal conductance models to explain these interesting results. This will be described by a new approach for thermal quantification – Force Spectroscopy SThM.

AB - Measurement of thermal properties at the nanoscale presents a number if unique challenges. Here we report the exploration of the thermal properties of a range of 2D materials crossing scanning thermal microscopy (SThM) results with finite elements (FE) simulations. The materials length scale was incremented from ca. 0.3nm (monolayer) to bulk on graphene and MoS2.SThM is a modification of the more well-known Atomic Force Microscope (AFM) employing a self-heated probe which is brought into contact with the sample correspondingly causing a drop in the probe temperature which can be electronically monitored and interpreted to understand the samples thermal properties. FE simulations were performed by COMSOL software which allows to model and predicts properties of our systems varying graphene isotropy and anisoptropy as well as substrate interactions. We have investigated how these properties change as a function of sample thickness on substrates of both high and low thermal conductivities. We observe well defined values of thermal conductance for monolayer and near monolayer thicknesses, however some materials show increased conductance at increasing multilayers whilst others show a decrease – in most cases the conductance does not scale simply with thickness. We discuss and compare experimental considerations and simulation outputs in order to construct a possible thermal conductance models to explain these interesting results. This will be described by a new approach for thermal quantification – Force Spectroscopy SThM.

M3 - Abstract

Y2 - 11 May 2015 through 15 May 2015

ER -