Research output: Contribution to Journal/Magazine › Journal article
Supply current monitoring in cmos circuits for reliability prediction and test. / Richardson, A. M. D.; Dorey, A. P.
In: Quality and Reliability Engineering International, Vol. 8, No. 6, 1992, p. 543-548.Research output: Contribution to Journal/Magazine › Journal article
}
TY - JOUR
T1 - Supply current monitoring in cmos circuits for reliability prediction and test.
AU - Richardson, A. M. D.
AU - Dorey, A. P.
PY - 1992
Y1 - 1992
N2 - The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.
AB - The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.
KW - IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing
U2 - 10.1002/qre.4680080606
DO - 10.1002/qre.4680080606
M3 - Journal article
VL - 8
SP - 543
EP - 548
JO - Quality and Reliability Engineering International
JF - Quality and Reliability Engineering International
SN - 0748-8017
IS - 6
ER -