Final published version
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
}
TY - CHAP
T1 - Suspended single-electron transistor as a detector of its nanomechanical motion
AU - Pashkin, Yuri
AU - Li, Tiefu
AU - Pekola, Jukka
AU - Astafiev, Oleg
AU - Knyazev, Dmitry
AU - Hoehne, Felix
AU - Im, Hyunsik
AU - Nakamura, Yasunobu
AU - Tsai, Jaw Shen
PY - 2010
Y1 - 2010
N2 - We have fabricated an Al based single-electron transistor transistor (SET) whose island is suspended above the substrate. The structure can be considered as a two-in-one device containing a doubly clamped beam and a transducer that converts mechanical vibrations into variations in the SET current. In addition to the regular side gate, a bottom gate with a large capacitance, is placed beneath the SET island for increasing the SET coupling to the mechanical motion. The observed response is reproduced in our simulations, which are based on the orthodox model that considers the fundamental flexural mode of the resonating SET island.
AB - We have fabricated an Al based single-electron transistor transistor (SET) whose island is suspended above the substrate. The structure can be considered as a two-in-one device containing a doubly clamped beam and a transducer that converts mechanical vibrations into variations in the SET current. In addition to the regular side gate, a bottom gate with a large capacitance, is placed beneath the SET island for increasing the SET coupling to the mechanical motion. The observed response is reproduced in our simulations, which are based on the orthodox model that considers the fundamental flexural mode of the resonating SET island.
KW - Doubly clamped beam
KW - Nanomechanical resonator
KW - Single-electron transistor
KW - Transducer
U2 - 10.1109/ICONN.2010.6045266
DO - 10.1109/ICONN.2010.6045266
M3 - Chapter
SN - 9781424452613
SP - 340
EP - 342
BT - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
PB - IEEE
T2 - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
Y2 - 22 February 2010 through 26 February 2010
ER -