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Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits. / Astafiev, Oleg V.; Pashkin, Yuri; Nakamura, Y. et al.
In: Physical review letters, Vol. 96, No. 13, 137001, 07.04.2006.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Astafiev, OV, Pashkin, Y, Nakamura, Y, Yamamoto, T & Tsai, J-S 2006, 'Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits', Physical review letters, vol. 96, no. 13, 137001. https://doi.org/10.1103/PhysRevLett.96.137001

APA

Astafiev, O. V., Pashkin, Y., Nakamura, Y., Yamamoto, T., & Tsai, J-S. (2006). Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits. Physical review letters, 96(13), Article 137001. https://doi.org/10.1103/PhysRevLett.96.137001

Vancouver

Astafiev OV, Pashkin Y, Nakamura Y, Yamamoto T, Tsai J-S. Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits. Physical review letters. 2006 Apr 7;96(13):137001. Epub 2006 Apr 4. doi: 10.1103/PhysRevLett.96.137001

Author

Astafiev, Oleg V. ; Pashkin, Yuri ; Nakamura, Y. et al. / Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits. In: Physical review letters. 2006 ; Vol. 96, No. 13.

Bibtex

@article{7ed58653b5514ffd9d285c0700fac825,
title = "Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits",
abstract = "To verify the hypothesis about the common origin of the low-frequency 1/f noise and the quantum fnoise recently measured in the Josephson charge qubits, we study the temperature dependence of the 1/f noise and decay of coherent oscillations. The T2 dependence of the 1/f noise is experimentally demonstrated, which supports the hypothesis. We also show that dephasing in the Josephson charge qubits off the electrostatic energy degeneracy point is consistently explained by the same low-frequency 1/f noise that is observed in the transport measurements.",
author = "Astafiev, {Oleg V.} and Yuri Pashkin and Y. Nakamura and T. Yamamoto and Jaw-Shen Tsai",
year = "2006",
month = apr,
day = "7",
doi = "10.1103/PhysRevLett.96.137001",
language = "English",
volume = "96",
journal = "Physical review letters",
issn = "0031-9007",
publisher = "American Physical Society",
number = "13",

}

RIS

TY - JOUR

T1 - Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits

AU - Astafiev, Oleg V.

AU - Pashkin, Yuri

AU - Nakamura, Y.

AU - Yamamoto, T.

AU - Tsai, Jaw-Shen

PY - 2006/4/7

Y1 - 2006/4/7

N2 - To verify the hypothesis about the common origin of the low-frequency 1/f noise and the quantum fnoise recently measured in the Josephson charge qubits, we study the temperature dependence of the 1/f noise and decay of coherent oscillations. The T2 dependence of the 1/f noise is experimentally demonstrated, which supports the hypothesis. We also show that dephasing in the Josephson charge qubits off the electrostatic energy degeneracy point is consistently explained by the same low-frequency 1/f noise that is observed in the transport measurements.

AB - To verify the hypothesis about the common origin of the low-frequency 1/f noise and the quantum fnoise recently measured in the Josephson charge qubits, we study the temperature dependence of the 1/f noise and decay of coherent oscillations. The T2 dependence of the 1/f noise is experimentally demonstrated, which supports the hypothesis. We also show that dephasing in the Josephson charge qubits off the electrostatic energy degeneracy point is consistently explained by the same low-frequency 1/f noise that is observed in the transport measurements.

U2 - 10.1103/PhysRevLett.96.137001

DO - 10.1103/PhysRevLett.96.137001

M3 - Journal article

VL - 96

JO - Physical review letters

JF - Physical review letters

SN - 0031-9007

IS - 13

M1 - 137001

ER -