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The effect of aluminium coating on elemental signals in X-ray microanalysis.

Research output: Contribution to Journal/MagazineJournal article

  • A. P. Reid
  • K. Oates
  • W. T. W. Potts
<mark>Journal publication date</mark>1993
<mark>Journal</mark>Microscopy Research and Technique
Issue number2
Number of pages5
Pages (from-to)168-172
Publication StatusPublished
<mark>Original language</mark>English


It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.