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The effect of aluminium coating on elemental signals in X-ray microanalysis.

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The effect of aluminium coating on elemental signals in X-ray microanalysis. / Reid, A. P.; Oates, K.; Potts, W. T. W.
In: Microscopy Research and Technique, Vol. 24, No. 2, 1993, p. 168-172.

Research output: Contribution to Journal/Magazine › Journal article

Harvard

Reid, AP, Oates, K & Potts, WTW 1993, 'The effect of aluminium coating on elemental signals in X-ray microanalysis.', Microscopy Research and Technique, vol. 24, no. 2, pp. 168-172. https://doi.org/10.1002/jemt.1070240208

APA

Reid, A. P., Oates, K., & Potts, W. T. W. (1993). The effect of aluminium coating on elemental signals in X-ray microanalysis. Microscopy Research and Technique, 24(2), 168-172. https://doi.org/10.1002/jemt.1070240208

Vancouver

Reid AP, Oates K, Potts WTW. The effect of aluminium coating on elemental signals in X-ray microanalysis. Microscopy Research and Technique. 1993;24(2):168-172. doi: 10.1002/jemt.1070240208

Author

Reid, A. P. ; Oates, K. ; Potts, W. T. W. / The effect of aluminium coating on elemental signals in X-ray microanalysis. In: Microscopy Research and Technique. 1993 ; Vol. 24, No. 2. pp. 168-172.

Bibtex

@article{7832a243a527481c91e71d4ea441e7d9,
title = "The effect of aluminium coating on elemental signals in X-ray microanalysis.",
abstract = "It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.",
keywords = "Charge dissipation • Absorption • Attenuation • Electron beam",
author = "Reid, {A. P.} and K. Oates and Potts, {W. T. W.}",
year = "1993",
doi = "10.1002/jemt.1070240208",
language = "English",
volume = "24",
pages = "168--172",
journal = "Microscopy Research and Technique",
issn = "1059-910X",
publisher = "Wiley-Liss Inc.",
number = "2",

}

RIS

TY - JOUR

T1 - The effect of aluminium coating on elemental signals in X-ray microanalysis.

AU - Reid, A. P.

AU - Oates, K.

AU - Potts, W. T. W.

PY - 1993

Y1 - 1993

N2 - It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.

AB - It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.

KW - Charge dissipation • Absorption • Attenuation • Electron beam

U2 - 10.1002/jemt.1070240208

DO - 10.1002/jemt.1070240208

M3 - Journal article

VL - 24

SP - 168

EP - 172

JO - Microscopy Research and Technique

JF - Microscopy Research and Technique

SN - 1059-910X

IS - 2

ER -