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The fabrication and characterization of polycrystalline CuSn bolometers.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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The fabrication and characterization of polycrystalline CuSn bolometers. / Giltrow, M.; Boylett, M. J.; Lawson, N. S. et al.
In: Measurement Science and Technology, Vol. 14, No. 10, 10.2003, p. N69-N71.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Giltrow, M, Boylett, MJ, Lawson, NS, Hammiche, A, Griffiths, OJ, Wigmore, JK & Efimov, V 2003, 'The fabrication and characterization of polycrystalline CuSn bolometers.', Measurement Science and Technology, vol. 14, no. 10, pp. N69-N71. https://doi.org/10.1088/0957-0233/14/10/401

APA

Giltrow, M., Boylett, M. J., Lawson, N. S., Hammiche, A., Griffiths, O. J., Wigmore, J. K., & Efimov, V. (2003). The fabrication and characterization of polycrystalline CuSn bolometers. Measurement Science and Technology, 14(10), N69-N71. https://doi.org/10.1088/0957-0233/14/10/401

Vancouver

Giltrow M, Boylett MJ, Lawson NS, Hammiche A, Griffiths OJ, Wigmore JK et al. The fabrication and characterization of polycrystalline CuSn bolometers. Measurement Science and Technology. 2003 Oct;14(10):N69-N71. doi: 10.1088/0957-0233/14/10/401

Author

Giltrow, M. ; Boylett, M. J. ; Lawson, N. S. et al. / The fabrication and characterization of polycrystalline CuSn bolometers. In: Measurement Science and Technology. 2003 ; Vol. 14, No. 10. pp. N69-N71.

Bibtex

@article{9df5ff930c294fdbb3c9ae0fb1d504fa,
title = "The fabrication and characterization of polycrystalline CuSn bolometers.",
abstract = "Polycrystalline CuSn thin films can be used as highly reproducible and easily fabricated bolometers for the temperature region of 1.3–3 K, an important range for both phonon pulse experiments and photon and particle detection. We report their fabrication and the dependence of their characteristic parameters on the evaporation melt and deposition conditions. The superconducting transition temperature of the films was determined predominantly by the alloy composition, the normal state resistance by the film thickness, and the bolometer sensitivity by the deposition rate. X-ray diffraction showed that the films were composites of Cu6Sn5 complexes and pure tin regions.",
keywords = "superconducting transition temperature, critical temperature, Cu6Sn5 alloy, phonons, thin film bolometers, transition edge sensors",
author = "M. Giltrow and Boylett, {M. J.} and Lawson, {N. S.} and A. Hammiche and Griffiths, {O. J.} and Wigmore, {J. K.} and V. Efimov",
year = "2003",
month = oct,
doi = "10.1088/0957-0233/14/10/401",
language = "English",
volume = "14",
pages = "N69--N71",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "10",

}

RIS

TY - JOUR

T1 - The fabrication and characterization of polycrystalline CuSn bolometers.

AU - Giltrow, M.

AU - Boylett, M. J.

AU - Lawson, N. S.

AU - Hammiche, A.

AU - Griffiths, O. J.

AU - Wigmore, J. K.

AU - Efimov, V.

PY - 2003/10

Y1 - 2003/10

N2 - Polycrystalline CuSn thin films can be used as highly reproducible and easily fabricated bolometers for the temperature region of 1.3–3 K, an important range for both phonon pulse experiments and photon and particle detection. We report their fabrication and the dependence of their characteristic parameters on the evaporation melt and deposition conditions. The superconducting transition temperature of the films was determined predominantly by the alloy composition, the normal state resistance by the film thickness, and the bolometer sensitivity by the deposition rate. X-ray diffraction showed that the films were composites of Cu6Sn5 complexes and pure tin regions.

AB - Polycrystalline CuSn thin films can be used as highly reproducible and easily fabricated bolometers for the temperature region of 1.3–3 K, an important range for both phonon pulse experiments and photon and particle detection. We report their fabrication and the dependence of their characteristic parameters on the evaporation melt and deposition conditions. The superconducting transition temperature of the films was determined predominantly by the alloy composition, the normal state resistance by the film thickness, and the bolometer sensitivity by the deposition rate. X-ray diffraction showed that the films were composites of Cu6Sn5 complexes and pure tin regions.

KW - superconducting transition temperature

KW - critical temperature

KW - Cu6Sn5 alloy

KW - phonons

KW - thin film bolometers

KW - transition edge sensors

U2 - 10.1088/0957-0233/14/10/401

DO - 10.1088/0957-0233/14/10/401

M3 - Journal article

VL - 14

SP - N69-N71

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 10

ER -