TY - JOUR

T1 - The FE-I4 telescope for particle tracking in testbeam experiments

AU - Benoit, M.

AU - Bilbao De Mendizabal, J.

AU - Di Bello, F. A.

AU - Ferrere, D.

AU - Golling, T.

AU - Gonzalez-Sevilla, S.

AU - Iacobucci, G.

AU - Kocian, M.

AU - Muenstermann, Daniel Matthias Alfred

AU - Ristic, B.

PY - 2016/7/5

Y1 - 2016/7/5

N2 - A testbeam telescope, based on ATLAS IBL silicon pixel modules, has been built. It comprises six planes of planar silicon sensors with 250 × 50 μ m2 pitch, read out by ATLAS FE-I4 chips. In the CERN SPS H8 beamline (180 GeV π+) a resolution of better than 8 × 12 μm2 at the position of the device under test was achieved. The telescope reached a trigger rate of 6 kHz with two measured devices. It is mainly designed for studies using FE-I4 based prototypes, but has also been successfully run with independent DAQ systems. Specialised trigger schemes ensure data synchronisation between these external devices and the telescope. A region-of-interest trigger can be formed by setting masks on the first and the last pixel sensor planes. The setup infrastructure provides centrally controlled and monitored high and low voltage power supplies, silicon oil cooling, temperature and humidity sensors and movable stages.

AB - A testbeam telescope, based on ATLAS IBL silicon pixel modules, has been built. It comprises six planes of planar silicon sensors with 250 × 50 μ m2 pitch, read out by ATLAS FE-I4 chips. In the CERN SPS H8 beamline (180 GeV π+) a resolution of better than 8 × 12 μm2 at the position of the device under test was achieved. The telescope reached a trigger rate of 6 kHz with two measured devices. It is mainly designed for studies using FE-I4 based prototypes, but has also been successfully run with independent DAQ systems. Specialised trigger schemes ensure data synchronisation between these external devices and the telescope. A region-of-interest trigger can be formed by setting masks on the first and the last pixel sensor planes. The setup infrastructure provides centrally controlled and monitored high and low voltage power supplies, silicon oil cooling, temperature and humidity sensors and movable stages.

KW - Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors)

KW - Particle tracking detectors (Solid-state detectors)

U2 - 10.1088/1748-0221/11/07/P07003

DO - 10.1088/1748-0221/11/07/P07003

M3 - Journal article

VL - 11

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

ER -