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Ultrasonic Force and Related Microscopies

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Ultrasonic Force and Related Microscopies. / Briggs, Andrew; Kolosov, Oleg V.
Advances in Acoustic Microscopy and High Resolution Imaging: From Principles to Applications. ed. / Roman Gr. Maev. Wiley-VCH, 2013. p. 277-306.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Briggs, A & Kolosov, OV 2013, Ultrasonic Force and Related Microscopies. in RG Maev (ed.), Advances in Acoustic Microscopy and High Resolution Imaging: From Principles to Applications. Wiley-VCH, pp. 277-306. https://doi.org/10.1002/9783527655304.ch11

APA

Briggs, A., & Kolosov, O. V. (2013). Ultrasonic Force and Related Microscopies. In R. G. Maev (Ed.), Advances in Acoustic Microscopy and High Resolution Imaging: From Principles to Applications (pp. 277-306). Wiley-VCH. https://doi.org/10.1002/9783527655304.ch11

Vancouver

Briggs A, Kolosov OV. Ultrasonic Force and Related Microscopies. In Maev RG, editor, Advances in Acoustic Microscopy and High Resolution Imaging: From Principles to Applications. Wiley-VCH. 2013. p. 277-306 doi: 10.1002/9783527655304.ch11

Author

Briggs, Andrew ; Kolosov, Oleg V. / Ultrasonic Force and Related Microscopies. Advances in Acoustic Microscopy and High Resolution Imaging: From Principles to Applications. editor / Roman Gr. Maev. Wiley-VCH, 2013. pp. 277-306

Bibtex

@inbook{8a7d6232dc42475e813bbb28eb74af8d,
title = "Ultrasonic Force and Related Microscopies",
abstract = "This chapter describes an approach that depends on the nonlinear nature of the interaction between tip and sample; this has become known as ultrasonic force microscopy (UFM). The combination of acoustic excitation with scanning probe microscopy makes it possible to image and study the elastic and viscoelastic properties of materials with nanoscale spatial resolution. For the applications described in the chapter, the key components of the UFM and the mechanical diode principle are: the inertial stiffness of the cantilever at the ultrasonic vibration frequency; nonlinear detection of additional forces at low frequency and the compliance of the cantilever at the detection frequency. The shape of the force versus indentation curve depends on surface adhesive and elastic properties. In addition to the elastic properties that UFM is intended to image, anything else that affects the tip‐surface interaction will also affect the UFM contrast.",
keywords = "Contact stiffness, Contrast theory, Mechanical diode detection, Nanoscale, Subsurface defects, Ultrasonic force microscopy",
author = "Andrew Briggs and Kolosov, {Oleg V.}",
year = "2013",
month = apr,
day = "12",
doi = "10.1002/9783527655304.ch11",
language = "English",
isbn = "9783527410569",
pages = "277--306",
editor = "Maev, {Roman Gr.}",
booktitle = "Advances in Acoustic Microscopy and High Resolution Imaging",
publisher = "Wiley-VCH",

}

RIS

TY - CHAP

T1 - Ultrasonic Force and Related Microscopies

AU - Briggs, Andrew

AU - Kolosov, Oleg V.

PY - 2013/4/12

Y1 - 2013/4/12

N2 - This chapter describes an approach that depends on the nonlinear nature of the interaction between tip and sample; this has become known as ultrasonic force microscopy (UFM). The combination of acoustic excitation with scanning probe microscopy makes it possible to image and study the elastic and viscoelastic properties of materials with nanoscale spatial resolution. For the applications described in the chapter, the key components of the UFM and the mechanical diode principle are: the inertial stiffness of the cantilever at the ultrasonic vibration frequency; nonlinear detection of additional forces at low frequency and the compliance of the cantilever at the detection frequency. The shape of the force versus indentation curve depends on surface adhesive and elastic properties. In addition to the elastic properties that UFM is intended to image, anything else that affects the tip‐surface interaction will also affect the UFM contrast.

AB - This chapter describes an approach that depends on the nonlinear nature of the interaction between tip and sample; this has become known as ultrasonic force microscopy (UFM). The combination of acoustic excitation with scanning probe microscopy makes it possible to image and study the elastic and viscoelastic properties of materials with nanoscale spatial resolution. For the applications described in the chapter, the key components of the UFM and the mechanical diode principle are: the inertial stiffness of the cantilever at the ultrasonic vibration frequency; nonlinear detection of additional forces at low frequency and the compliance of the cantilever at the detection frequency. The shape of the force versus indentation curve depends on surface adhesive and elastic properties. In addition to the elastic properties that UFM is intended to image, anything else that affects the tip‐surface interaction will also affect the UFM contrast.

KW - Contact stiffness

KW - Contrast theory

KW - Mechanical diode detection

KW - Nanoscale

KW - Subsurface defects

KW - Ultrasonic force microscopy

U2 - 10.1002/9783527655304.ch11

DO - 10.1002/9783527655304.ch11

M3 - Chapter

AN - SCOPUS:84882777486

SN - 9783527410569

SP - 277

EP - 306

BT - Advances in Acoustic Microscopy and High Resolution Imaging

A2 - Maev, Roman Gr.

PB - Wiley-VCH

ER -