Press/Media

• Novel materials-analysis technique promises to reduce costs of high-tech manufacturing

  Press/Media: Research

• Lancaster University launches spin-out

  Press/Media: Research

Research outputs

• Method and apparatus for ion beam polishing

  Research output: Patent

• Seeing the invisible - ultrasonic force microscopy for true subsurface elastic imaging of semiconductor nanostructures with nanoscale resolution

  Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

• Mapping nanomechanical phenomena in graphene nanostructures using force modulation and ultrasonic force microscopy

  Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

• Nanoscale SPM characterisation of nacre aragonite plates and synthetic human amyloid fibres

  Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

• Direct nanoscale 3D characterisation of Ge-Sb-Te and Ge-Te phase change films

  Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

• Advances in Spectroscopy and Imaging of Surfaces and Nanostructures: Symposium held November 29–December 3, Boston, Massachusetts, U.S.A.

  Research output: Book/Report/Proceedings › Proceedings

• Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope

  Research output: Patent

• Ultrasonic force microscopies

  Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)

• Interatomic force microscope and sample observing method therefor

  Research output: Patent

• Interatomic force microscope and sample observing method therefor

  Research output: Patent

• Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope

  Research output: Patent

• High-accuracy analysis of nanoscale semiconductor layers using beam-exit Ar-ion polishing and scanning probe microscopy

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Three-dimensional nanomechanical mapping of amorphous and crystalline phase transitions in phase change materials

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Multidimensional SPM applied for Nanoscale Conductance Mapping

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Nanosecond switching in GeSe phase change memory films by atomic force microscopy

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Nanomechanical morphology of amorphous, transition, and crystalline domains in phase change memory thin films

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Method for ion beam polishing and polished sample

  Research output: Patent

• Mapping nanosecond time scale nanoelectromechanical phenomena in 2D Materials on nanometre length scale via ultrasonic and heterodyne force microscopies

  Research output: Contribution to conference - Without ISBN/ISSN › Speech

• Structural Characterisation of ALD coated Porous Si via Beam-Exit Cross-Sectional Polishing

  Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

• Novel nanoscale method for thermal conductivity measurements

  Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

• Mapping of vibrational modes of nanoscale membranes via scanning probe microscopy

  Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

• Advances in Spectroscopy and Imaging of Surfaces and Nanostructures: Preface

  Research output: Contribution to Journal/Magazine › Editorial › peer-review

• Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Mapping nanoscale dynamic properties of suspended and supported multi-layer graphene membranes via contact resonance and ultrasonic scanning probe microscopies

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Solution-processed thin film transistors incorporating YSZ gate dielectrics processed at 400 °C

  Research output: Contribution to Journal/Magazine › Journal article › peer-review