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Extremely Low Excess Noise in InAs Electron Avalanche Photodiodes

Research output: Contribution to journalJournal article

<mark>Journal publication date</mark>1/07/2009
<mark>Journal</mark>IEEE Photonics Technology Letters
Issue number13
Number of pages3
Pages (from-to)866-868
<mark>Original language</mark>English


Measurements of the avalanche multiplication noise in InAs p-i-n and n-i-p diodes at room temperature demonstrate unambiguously that the avalanche multiplication process is dominated by impact ionization of electrons. This results in the excess noise factor for electron initiated multiplication asymptotically approaching a maximum value just less than two and becoming virtually gain-independent for higher gains. Measurements for predominantly hole initiated multiplication show corresponding high excess noise factors suggesting the electron to hole ionization coefficient ratios are comparable to those reported for Hg1-xCdxTe electron avalanche photodiodes.