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Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

Research output: Contribution to conference - Without ISBN/ISSN Poster

Published
Publication date2/08/2019
Original languageEnglish
EventThe 22nd International Conference on Non-contact Atomic Force Microscopy - University of Regensburg, Regensburg, Germany
Duration: 29/07/20192/08/2019
http://www.physik.ur.de/ncafm22/

Conference

ConferenceThe 22nd International Conference on Non-contact Atomic Force Microscopy
Abbreviated titlencAFM22
CountryGermany
CityRegensburg
Period29/07/192/08/19
Internet address