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Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

Research output: Contribution to conference - Without ISBN/ISSN Posterpeer-review

Published

Standard

Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. / Kolosov, Oleg; Mucientes, Marta; Forcieri, Leonardo et al.
2019. Poster session presented at The 22nd International Conference on Non-contact Atomic Force Microscopy, Regensburg, Germany.

Research output: Contribution to conference - Without ISBN/ISSN Posterpeer-review

Harvard

Kolosov, O, Mucientes, M, Forcieri, L & Jarvis, S 2019, 'Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy', The 22nd International Conference on Non-contact Atomic Force Microscopy, Regensburg, Germany, 29/07/19 - 2/08/19.

APA

Kolosov, O., Mucientes, M., Forcieri, L., & Jarvis, S. (2019). Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. Poster session presented at The 22nd International Conference on Non-contact Atomic Force Microscopy, Regensburg, Germany.

Vancouver

Kolosov O, Mucientes M, Forcieri L, Jarvis S. Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. 2019. Poster session presented at The 22nd International Conference on Non-contact Atomic Force Microscopy, Regensburg, Germany.

Author

Kolosov, Oleg ; Mucientes, Marta ; Forcieri, Leonardo et al. / Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. Poster session presented at The 22nd International Conference on Non-contact Atomic Force Microscopy, Regensburg, Germany.

Bibtex

@conference{18c856ef0e384d12862ac713ae98ea8e,
title = "Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy",
author = "Oleg Kolosov and Marta Mucientes and Leonardo Forcieri and Samuel Jarvis",
year = "2019",
month = aug,
day = "2",
language = "English",
note = "The 22nd International Conference on Non-contact Atomic Force Microscopy, ncAFM22 ; Conference date: 29-07-2019 Through 02-08-2019",
url = "http://www.physik.ur.de/ncafm22/",

}

RIS

TY - CONF

T1 - Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

AU - Kolosov, Oleg

AU - Mucientes, Marta

AU - Forcieri, Leonardo

AU - Jarvis, Samuel

PY - 2019/8/2

Y1 - 2019/8/2

M3 - Poster

T2 - The 22nd International Conference on Non-contact Atomic Force Microscopy

Y2 - 29 July 2019 through 2 August 2019

ER -