Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

Research output: Contribution to conference - Without ISBN/ISSN › Poster › peer-review

Published

Publication date	2/08/2019
<mark>Original language</mark>	English
Event	The 22nd International Conference on Non-contact Atomic Force Microscopy - University of Regensburg, Regensburg, Germany Duration: 29/07/2019 → 2/08/2019 http://www.physik.ur.de/ncafm22/

Conference	The 22nd International Conference on Non-contact Atomic Force Microscopy
Abbreviated title	ncAFM22
Country/Territory	Germany
City	Regensburg
Period	29/07/19 → 2/08/19
Internet address	http://www.physik.ur.de/ncafm22/

Research