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Waveguide ultrasonic force microscopy at 60 MHz

Research output: Contribution to journalJournal article

Published

Journal publication date3/04/2000
JournalApplied Physics Letters
Journal number14
Volume76
Number of pages3
Pages1836-1838
Original languageEnglish

Abstract

We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.