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Waveguide ultrasonic force microscopy at 60 MHz

Research output: Contribution to journalJournal article


<mark>Journal publication date</mark>3/04/2000
<mark>Journal</mark>Applied Physics Letters
Number of pages3
<mark>Original language</mark>English


We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.