Research output: Contribution to Journal/Magazine › Journal article › peer-review
<mark>Journal publication date</mark> | 3/04/2000 |
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<mark>Journal</mark> | Applied Physics Letters |
Issue number | 14 |
Volume | 76 |
Number of pages | 3 |
Pages (from-to) | 1836-1838 |
Publication Status | Published |
<mark>Original language</mark> | English |
We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.