Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Waveguide ultrasonic force microscopy at 60 MHz
AU - Inagaki, K.
AU - Kolosov, Oleg
AU - Briggs, G. Andrew D.
AU - Wright, O. B.
PY - 2000/4/3
Y1 - 2000/4/3
N2 - We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.
AB - We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.
U2 - 10.1063/1.126184
DO - 10.1063/1.126184
M3 - Journal article
VL - 76
SP - 1836
EP - 1838
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 14
ER -