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Waveguide ultrasonic force microscopy at 60 MHz

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Waveguide ultrasonic force microscopy at 60 MHz. / Inagaki, K. ; Kolosov, Oleg ; Briggs, G. Andrew D. ; Wright, O. B. .

In: Applied Physics Letters, Vol. 76, No. 14, 03.04.2000, p. 1836-1838.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Inagaki, K, Kolosov, O, Briggs, GAD & Wright, OB 2000, 'Waveguide ultrasonic force microscopy at 60 MHz', Applied Physics Letters, vol. 76, no. 14, pp. 1836-1838. https://doi.org/10.1063/1.126184

APA

Inagaki, K., Kolosov, O., Briggs, G. A. D., & Wright, O. B. (2000). Waveguide ultrasonic force microscopy at 60 MHz. Applied Physics Letters, 76(14), 1836-1838. https://doi.org/10.1063/1.126184

Vancouver

Inagaki K, Kolosov O, Briggs GAD, Wright OB. Waveguide ultrasonic force microscopy at 60 MHz. Applied Physics Letters. 2000 Apr 3;76(14):1836-1838. https://doi.org/10.1063/1.126184

Author

Inagaki, K. ; Kolosov, Oleg ; Briggs, G. Andrew D. ; Wright, O. B. . / Waveguide ultrasonic force microscopy at 60 MHz. In: Applied Physics Letters. 2000 ; Vol. 76, No. 14. pp. 1836-1838.

Bibtex

@article{897d0e18e56e4c90b655f59ccc80303d,
title = "Waveguide ultrasonic force microscopy at 60 MHz",
abstract = "We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a {"}waveguide{"} mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve. ",
author = "K. Inagaki and Oleg Kolosov and Briggs, {G. Andrew D.} and Wright, {O. B.}",
year = "2000",
month = apr,
day = "3",
doi = "10.1063/1.126184",
language = "English",
volume = "76",
pages = "1836--1838",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Inc.",
number = "14",

}

RIS

TY - JOUR

T1 - Waveguide ultrasonic force microscopy at 60 MHz

AU - Inagaki, K.

AU - Kolosov, Oleg

AU - Briggs, G. Andrew D.

AU - Wright, O. B.

PY - 2000/4/3

Y1 - 2000/4/3

N2 - We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve. 

AB - We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve. 

U2 - 10.1063/1.126184

DO - 10.1063/1.126184

M3 - Journal article

VL - 76

SP - 1836

EP - 1838

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 14

ER -