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Professor Oleg Kolosov SFHEA

Professor of Nanoscience

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  1. Published

    Nanoscale elastic imaging: a new metrology tool for low-k dielectric integration

    Shekhawat, G. S., Kolosov, O., Briggs, G. A. D., Shaffer, E. O., Martin, S. J. & Geer, R. E., 2000, Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International . New York: IEEE, p. 96-98 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  2. Published

    Nanoscale elastic imaging and mechanical modulus measurements of aluminum/low-k dielectric interconnect structures

    Shekhawat, G. S., Briggs, G. A. D., Kolosov, O. & Geer, R. E., 2001, Characterization and metrology for ULSI Technology 2000, International Conference. Seiler, D. G., Diebold, A. C., Shaffner, T. J., McDonald, R., Bullis, W. M., Smith, P. J. & Secula, E. M. (eds.). Melville, New York: American Institute of Physics, p. 449-452 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Nanoscale elastic imaging of aluminum/low-k dielectric interconnect structures

    Shekhawat, G. S., Kolosov, O. V., Briggs, G. A. D., Shaffer, E. O., Martin, S. & Geer, R. E., 1/01/2000, In: Materials Research Society Symposium-Proceedings. 612, p. D171-D177 7 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Optical investigation of the natural electron doping in thin MoS2 films deposited on dielectric substrates

    Sercombe, D., Schwarz, S., Del Pozo-Zamudio, O., Liu, F., J. Robinson, B., A. Chekhovich, E., I. Tartakovskii, I., Kolosov, O. & I. Tartakovskii, A., 12/12/2013, In: Scientific Reports. 3, 6 p., 03489.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. Published

    Acoustic Imaging of Plate Thickness and Sound Velocity during Tensile Testing at Low Temperature

    Sato, H., Kolosov, O., Nagata, Y., Koda, T. & Yamanaka, K., 11/1994, In: Japanese Journal of Applied Physics. 33, 11, p. 6373-6378 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    Mapping of vibrational modes of nanoscale membranes via scanning probe microscopy

    San Juan Mucientes, M. & Kolosov, O. V., 3/07/2017. 2 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

  7. Published

    Subsurface imaging of stacking faults and dislocations in WS2 CVD grown flakes via Ultrasonic and Heterodyne Force Microscopy

    San Juan Mucientes, M., Shearer, M., Hamers, B., Zhao, Y., Jin, S. & Kolosov, O. V., 11/10/2017.

    Research output: Contribution to conference - Without ISBN/ISSN › Poster

  8. Published

    Mapping vibrational modes of Si3N4 membrane - Ultrasonic Force Microscopies vs Laser Doppler Vibrometry

    San Juan Mucientes, M. & Kolosov, O. V., 19/12/2017.

    Research output: Contribution to conference - Without ISBN/ISSN › Poster

  9. Published

    Comparison of Local Dynamic Response of MEMS Nanostructures Using Ultrasonic Force Microscopy and Laser Doppler Vibrometry

    San Juan Mucientes, M., McNair, R., Peasey, A., Shao, S., Wengraf, J., Lulla Ramrakhiyani, K., Robinson, B. J. & Kolosov, O. V., 4/04/2018.

    Research output: Contribution to conference - Without ISBN/ISSN › Poster

  10. Published

    Nanomechanical Visualisation of Subsurface Defects in WS2/WSe2 CVD Flakes via Ultrasonic Force Microscopies

    San Juan Mucientes, M., Shearer, M. J., Hamers, B., Zhao, Y., Jin, S. & Kolosov, O. V., 4/04/2018.

    Research output: Contribution to conference - Without ISBN/ISSN › Poster

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