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Professor Tracy Hall

Chair in Software Engineering

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  1. Conference contribution/Paper
  2. Published

    How Effectively Is Defective Code Actually Tested? An Analysis of JUnit Tests in Seven Open Source Systems

    Petric, J., Hall, T. & Bowes, D., 10/10/2018, Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York, NY, USA: ACM, p. 42-51 10 p. (PROMISE'18).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Mining communication patterns in software development: A GitHub analysis

    Ortu, M., Hall, T., Marchesi, M., Tonelli, R., Bowes, D. & Destefanis, G., 10/10/2018, PROMISE'18 Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York: ACM, p. 70-79 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  4. Published

    Code cleaning for software defect prediction: A cautionary tale

    Shippey, T., Bowes, D., Counsell, S. & Hall, T., 29/08/2018, 2018 44th Euromicro Conference on Software Engineering and Advanced Applications (SEAA). IEEE, p. 239-243 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  5. Published

    The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract)

    Kirbas, S., Caglayan, B., Hall, T., Counsell, S., Bowes, D., Sen, A. & Bener, A., 2/04/2018, 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 471 1 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  6. Published

    Getting defect prediction into industrial practice: The ELFF tool

    Bowes, D., Counsell, S., Hall, T., Petric, J. & Shippey, T., 14/11/2017, Proceedings - 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops, ISSREW 2017. Institute of Electrical and Electronics Engineers Inc., p. 44-47 4 p. 8109247

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Assert use and defectiveness in industrial code

    Counsell, S., Hall, T., Shippey, T., Bowes, D., Tahir, A. & MacDonell, S., 14/11/2017, Proceedings - 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops, ISSREW 2017. Institute of Electrical and Electronics Engineers Inc., p. 20-23 4 p. 8109241

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    How Good Are My Tests?

    Bowes, D., Hall, T., Petrić, J., Shippey, T. & Turhan, B., 3/07/2017, 2017 IEEE/ACM 8th Workshop on Emerging Trends in Software Metrics (WETSoM). IEEE Computer Society, p. 9-14 6 p. 7968009. (2017 IEEE/ACM 8th Workshop on Emerging Trends in Software Metrics (WETSoM)).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  9. Published

    Building an Ensemble for Software Defect Prediction Based on Diversity Selection

    Petrić, J., Bowes, D., Hall, T., Christianson, B. & Baddoo, N., 8/09/2016, ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement. New York: Association for Computing Machinery, Inc, 10 p. 46

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  10. Published

    So You Need More Method Level Datasets for Your Software Defect Prediction? Voilà!

    Shippey, T., Hall, T., Counsell, S. & Bowes, D., 8/09/2016, ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement. New York: IEEE Computer Society, 6 p. 12

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  11. Published

    Mutation-aware fault prediction

    Bowes, D., Hall, T., Harman, M., Jia, Y., Sarro, F. & Wu, F., 18/07/2016, ISSTA 2016 Proceedings of the 25th International Symposium on Software Testing and Analysis. New York: Association for Computing Machinery, Inc, p. 330-341 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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