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Beating limitations of surface-bound SPM to explore nanoscale 3D physical properties of advanced materials and devices

Research output: Contribution to conference - Without ISBN/ISSN Speech

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Beating limitations of surface-bound SPM to explore nanoscale 3D physical properties of advanced materials and devices. / Kolosov, Oleg.
2021. EU AFMi User Meeting, Germany.

Research output: Contribution to conference - Without ISBN/ISSN Speech

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@conference{d6ba16ad360b447a9168d2e2db785c1a,
title = "Beating limitations of surface-bound SPM to explore nanoscale 3D physical properties of advanced materials and devices",
abstract = "While SPM enjoys great success in materials science due to outstanding sensitivity to local nanoscale physical properties of materials and devices, with lateral resolution down to atomic scale, these studies are inevitably bound to the immediate sample surface. This lecture presents successes and challenges of several key approaches allowing SPM to explore internal structure of studied samples ranging from the semiconductors to biological materials. These include Ar-ion nano-cross-sectioning SPM (xSPM), real time SPM nanotomography and ultrasound based subsurface SPM imaging.",
keywords = "AFM, UFM ultrasonic force microscopy, 3D, subsurface, three dimensional",
author = "Oleg Kolosov",
year = "2021",
month = mar,
day = "10",
language = "English",
note = "EU AFMi User Meeting ; Conference date: 10-03-2021 Through 10-03-2021",
url = "https://mbns.bruker.com/acton/form/9063/04f9:d-0005/0/-/-/-/-/index.htm",

}

RIS

TY - CONF

T1 - Beating limitations of surface-bound SPM to explore nanoscale 3D physical properties of advanced materials and devices

AU - Kolosov, Oleg

PY - 2021/3/10

Y1 - 2021/3/10

N2 - While SPM enjoys great success in materials science due to outstanding sensitivity to local nanoscale physical properties of materials and devices, with lateral resolution down to atomic scale, these studies are inevitably bound to the immediate sample surface. This lecture presents successes and challenges of several key approaches allowing SPM to explore internal structure of studied samples ranging from the semiconductors to biological materials. These include Ar-ion nano-cross-sectioning SPM (xSPM), real time SPM nanotomography and ultrasound based subsurface SPM imaging.

AB - While SPM enjoys great success in materials science due to outstanding sensitivity to local nanoscale physical properties of materials and devices, with lateral resolution down to atomic scale, these studies are inevitably bound to the immediate sample surface. This lecture presents successes and challenges of several key approaches allowing SPM to explore internal structure of studied samples ranging from the semiconductors to biological materials. These include Ar-ion nano-cross-sectioning SPM (xSPM), real time SPM nanotomography and ultrasound based subsurface SPM imaging.

KW - AFM

KW - UFM ultrasonic force microscopy

KW - 3D

KW - subsurface

KW - three dimensional

M3 - Speech

T2 - EU AFMi User Meeting

Y2 - 10 March 2021 through 10 March 2021

ER -