Final published version
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Benchmarking of electro-optic monitors for femtosecond electron bunches
AU - Berden, G.
AU - Gillespie, W.A.
AU - Jamison, S.P.
AU - Knabbe, E.-A.
AU - MacLeod, A.M.
AU - Van Der Meer, A.F.G.
AU - Phillips, P.J.
AU - Schlarb, H.
AU - Schmidt, B.
AU - Schmüser, P.
AU - Steffen, B.
PY - 2007/10/17
Y1 - 2007/10/17
N2 - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
AB - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
U2 - 10.1103/PhysRevLett.99.164801
DO - 10.1103/PhysRevLett.99.164801
M3 - Journal article
VL - 99
JO - Physical review letters
JF - Physical review letters
SN - 1079-7114
IS - 16
M1 - 164801
ER -