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Cantilever resonance detected by tunneling current under application of RF signal

Research output: Contribution to journalJournal articlepeer-review

<mark>Journal publication date</mark>2007
<mark>Journal</mark>Japanese Journal of Applied Physics
Issue number5A
Number of pages3
Pages (from-to)3152-3154
Publication StatusPublished
<mark>Original language</mark>English


Cantilever resonance is detected by a tunneling current between a scanning tunneling microscope probe and an Au-Ti-coated SiO2 cantilever on a Si substrate under the application of an RF signal from a Si back electrode under the SiO2 layer. The cantilever resonance frequency obtained by tunneling current measurements corresponds well with those obtained by displacement current measurements between a cantilever array and the Si back electrode. The tunneling current at the resonant condition depended on the power of the RF signal. The vibration amplitude of the cantilever was evaluated to be of the order of 1-3 angstrom by the tunneling current.