Standard
Challenges in chip design for the AGIPD detector. / Shi, X.; Dinapoli, R.; Henrich, B. et al.
In:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 624, No. 2, 11.12.2010, p. 387-391.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Harvard
Shi, X, Dinapoli, R, Henrich, B, Mozzanica, A, Schmitt, B, Mazzocco, R, Krüger, H, Trunk, U & Graafsma, H 2010, '
Challenges in chip design for the AGIPD detector',
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 624, no. 2, pp. 387-391.
https://doi.org/10.1016/j.nima.2010.05.038
APA
Shi, X., Dinapoli, R., Henrich, B., Mozzanica, A., Schmitt, B., Mazzocco, R., Krüger, H., Trunk, U., & Graafsma, H. (2010).
Challenges in chip design for the AGIPD detector.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
624(2), 387-391.
https://doi.org/10.1016/j.nima.2010.05.038
Vancouver
Shi X, Dinapoli R, Henrich B, Mozzanica A, Schmitt B, Mazzocco R et al.
Challenges in chip design for the AGIPD detector.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2010 Dec 11;624(2):387-391. doi: 10.1016/j.nima.2010.05.038
Author
Shi, X. ; Dinapoli, R. ; Henrich, B. et al. /
Challenges in chip design for the AGIPD detector. In:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2010 ; Vol. 624, No. 2. pp. 387-391.
Bibtex
@article{08313bbeeccf43a8ad48ef7d76cd55c7,
title = "Challenges in chip design for the AGIPD detector",
abstract = "Adaptive Gain Integrating Pixel Detector (AGIPD) is currently under development for the European X-ray Free Electron Laser (XFEL). It is a hybrid pixel detector with a specifically developed readout chip bump bonded to a silicon sensor. The chip is being designed in IBM View the MathML source CMOS technology. This paper is focused on the readout chip design. The main challenges for this chip are: the high dynamic range (1–1.4×104) with single photon sensitivity, the long storage chain (≥200) with a long hold time (99 ms), and the high radiation dose (up to 100 MGy). A charge integrating amplifier with a gain adaptive to the number of incoming photons is combined with a correlated double sampling (CDS) buffer to achieve the required dynamic range and single photon sensitivity. Several techniques are implemented in the storage cell design in order to reduce leakage current and signal-dependent charge injection. Four prototype chips have been designed for testing the performance of the implemented switches, capacitors, amplifiers, storage cells and periphery circuitry. The recently submitted test chip has a 16×16 pixel matrix, 100 storage cells in each pixel and a periphery circuitry for accessing and controlling the pixels and storage cells.",
keywords = "Hybrid pixel detector, CMOS , Charge integrating , Adaptive gain , Correlated double sampling , X-ray free electron laser",
author = "X. Shi and R. Dinapoli and B. Henrich and A. Mozzanica and B. Schmitt and R. Mazzocco and H. Kr{\"u}ger and U. Trunk and H. Graafsma",
year = "2010",
month = dec,
day = "11",
doi = "10.1016/j.nima.2010.05.038",
language = "English",
volume = "624",
pages = "387--391",
journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "ELSEVIER SCIENCE BV",
number = "2",
}
RIS
TY - JOUR
T1 - Challenges in chip design for the AGIPD detector
AU - Shi, X.
AU - Dinapoli, R.
AU - Henrich, B.
AU - Mozzanica, A.
AU - Schmitt, B.
AU - Mazzocco, R.
AU - Krüger, H.
AU - Trunk, U.
AU - Graafsma, H.
PY - 2010/12/11
Y1 - 2010/12/11
N2 - Adaptive Gain Integrating Pixel Detector (AGIPD) is currently under development for the European X-ray Free Electron Laser (XFEL). It is a hybrid pixel detector with a specifically developed readout chip bump bonded to a silicon sensor. The chip is being designed in IBM View the MathML source CMOS technology. This paper is focused on the readout chip design. The main challenges for this chip are: the high dynamic range (1–1.4×104) with single photon sensitivity, the long storage chain (≥200) with a long hold time (99 ms), and the high radiation dose (up to 100 MGy). A charge integrating amplifier with a gain adaptive to the number of incoming photons is combined with a correlated double sampling (CDS) buffer to achieve the required dynamic range and single photon sensitivity. Several techniques are implemented in the storage cell design in order to reduce leakage current and signal-dependent charge injection. Four prototype chips have been designed for testing the performance of the implemented switches, capacitors, amplifiers, storage cells and periphery circuitry. The recently submitted test chip has a 16×16 pixel matrix, 100 storage cells in each pixel and a periphery circuitry for accessing and controlling the pixels and storage cells.
AB - Adaptive Gain Integrating Pixel Detector (AGIPD) is currently under development for the European X-ray Free Electron Laser (XFEL). It is a hybrid pixel detector with a specifically developed readout chip bump bonded to a silicon sensor. The chip is being designed in IBM View the MathML source CMOS technology. This paper is focused on the readout chip design. The main challenges for this chip are: the high dynamic range (1–1.4×104) with single photon sensitivity, the long storage chain (≥200) with a long hold time (99 ms), and the high radiation dose (up to 100 MGy). A charge integrating amplifier with a gain adaptive to the number of incoming photons is combined with a correlated double sampling (CDS) buffer to achieve the required dynamic range and single photon sensitivity. Several techniques are implemented in the storage cell design in order to reduce leakage current and signal-dependent charge injection. Four prototype chips have been designed for testing the performance of the implemented switches, capacitors, amplifiers, storage cells and periphery circuitry. The recently submitted test chip has a 16×16 pixel matrix, 100 storage cells in each pixel and a periphery circuitry for accessing and controlling the pixels and storage cells.
KW - Hybrid pixel detector
KW - CMOS
KW - Charge integrating
KW - Adaptive gain
KW - Correlated double sampling
KW - X-ray free electron laser
U2 - 10.1016/j.nima.2010.05.038
DO - 10.1016/j.nima.2010.05.038
M3 - Journal article
VL - 624
SP - 387
EP - 391
JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
SN - 0168-9002
IS - 2
ER -