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Characterisation of disorder in semiconductors via single-photon interferometry.

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Characterisation of disorder in semiconductors via single-photon interferometry. / Bozsoki, P.; Thomas, P.; Kira, M. et al.
In: Physical review letters, Vol. 97, No. 22, 2006, p. 227402 (4 pages).

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Bozsoki, P, Thomas, P, Kira, M, Hoyer, W, Meier, T, Koch, SW, Maschke, K, Varga, I & Stolz, H 2006, 'Characterisation of disorder in semiconductors via single-photon interferometry.', Physical review letters, vol. 97, no. 22, pp. 227402 (4 pages). https://doi.org/10.1103/PhysRevLett.97.227402

APA

Bozsoki, P., Thomas, P., Kira, M., Hoyer, W., Meier, T., Koch, S. W., Maschke, K., Varga, I., & Stolz, H. (2006). Characterisation of disorder in semiconductors via single-photon interferometry. Physical review letters, 97(22), 227402 (4 pages). https://doi.org/10.1103/PhysRevLett.97.227402

Vancouver

Bozsoki P, Thomas P, Kira M, Hoyer W, Meier T, Koch SW et al. Characterisation of disorder in semiconductors via single-photon interferometry. Physical review letters. 2006;97(22):227402 (4 pages). doi: 10.1103/PhysRevLett.97.227402

Author

Bozsoki, P. ; Thomas, P. ; Kira, M. et al. / Characterisation of disorder in semiconductors via single-photon interferometry. In: Physical review letters. 2006 ; Vol. 97, No. 22. pp. 227402 (4 pages).

Bibtex

@article{e1064d88ee784af88d0b6ed140758e0b,
title = "Characterisation of disorder in semiconductors via single-photon interferometry.",
abstract = "The method of angular photonic correlations of spontaneous emission is introduced as an experimental, purely optical scheme to characterize disorder in semiconductor nanostructures. The theoretical expression for the angular correlations is derived and numerically evaluated for a model system. The results demonstrate how the proposed experimental method yields direct information about the spatial distribution of the relevant states and thus on the disorder present in the system.",
author = "P. Bozsoki and P. Thomas and M. Kira and W. Hoyer and T. Meier and Koch, {S. W.} and K. Maschke and I. Varga and H. Stolz",
year = "2006",
doi = "10.1103/PhysRevLett.97.227402",
language = "English",
volume = "97",
pages = "227402 (4 pages)",
journal = "Physical review letters",
publisher = "American Physical Society",
number = "22",

}

RIS

TY - JOUR

T1 - Characterisation of disorder in semiconductors via single-photon interferometry.

AU - Bozsoki, P.

AU - Thomas, P.

AU - Kira, M.

AU - Hoyer, W.

AU - Meier, T.

AU - Koch, S. W.

AU - Maschke, K.

AU - Varga, I.

AU - Stolz, H.

PY - 2006

Y1 - 2006

N2 - The method of angular photonic correlations of spontaneous emission is introduced as an experimental, purely optical scheme to characterize disorder in semiconductor nanostructures. The theoretical expression for the angular correlations is derived and numerically evaluated for a model system. The results demonstrate how the proposed experimental method yields direct information about the spatial distribution of the relevant states and thus on the disorder present in the system.

AB - The method of angular photonic correlations of spontaneous emission is introduced as an experimental, purely optical scheme to characterize disorder in semiconductor nanostructures. The theoretical expression for the angular correlations is derived and numerically evaluated for a model system. The results demonstrate how the proposed experimental method yields direct information about the spatial distribution of the relevant states and thus on the disorder present in the system.

U2 - 10.1103/PhysRevLett.97.227402

DO - 10.1103/PhysRevLett.97.227402

M3 - Journal article

VL - 97

SP - 227402 (4 pages)

JO - Physical review letters

JF - Physical review letters

IS - 22

ER -