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Complex design of dissipation signals in non-contact atomic force microscopy

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Complex design of dissipation signals in non-contact atomic force microscopy. / Bamidele, J.; Li, Y. J.; Jarvis, S.; Naitoh, Y.; Sugawara, Y.; Kantorovich, L.

In: Physical Chemistry Chemical Physics, Vol. 14, No. 47, 16250, 01.12.2012.

Research output: Contribution to journalJournal articlepeer-review

Harvard

Bamidele, J, Li, YJ, Jarvis, S, Naitoh, Y, Sugawara, Y & Kantorovich, L 2012, 'Complex design of dissipation signals in non-contact atomic force microscopy', Physical Chemistry Chemical Physics, vol. 14, no. 47, 16250. https://doi.org/10.1039/c2cp43121a

APA

Bamidele, J., Li, Y. J., Jarvis, S., Naitoh, Y., Sugawara, Y., & Kantorovich, L. (2012). Complex design of dissipation signals in non-contact atomic force microscopy. Physical Chemistry Chemical Physics, 14(47), [16250]. https://doi.org/10.1039/c2cp43121a

Vancouver

Bamidele J, Li YJ, Jarvis S, Naitoh Y, Sugawara Y, Kantorovich L. Complex design of dissipation signals in non-contact atomic force microscopy. Physical Chemistry Chemical Physics. 2012 Dec 1;14(47). 16250. https://doi.org/10.1039/c2cp43121a

Author

Bamidele, J. ; Li, Y. J. ; Jarvis, S. ; Naitoh, Y. ; Sugawara, Y. ; Kantorovich, L. / Complex design of dissipation signals in non-contact atomic force microscopy. In: Physical Chemistry Chemical Physics. 2012 ; Vol. 14, No. 47.

Bibtex

@article{f189dcbd20824548ad1c858efff45281,
title = "Complex design of dissipation signals in non-contact atomic force microscopy",
abstract = "Complex interplay between topography and dissipation signals in Non-Contact Atomic Force Microscopy (NC-AFM) is studied by a combination of state-of-the-art theory and experiment applied to the Si(001) surface prone to instabilities. Considering a wide range of tip-sample separations down to the near-contact regime and several tip models, both stiff and more flexible, a sophisticated architecture of hysteresis loops in the simulated tip force-distance curves is revealed. At small tip-surface distances the dissipation was found to be comprised of two related contributions due to both the surface and tip. These are accompanied by the corresponding surface and tip distortion approach-retraction dynamics. Qualitative conclusions drawn from the theoretical simulations such as large dissipation signals (textgreater1.0 eV) and a step-like dissipation dependent on the tip-surface distance are broadly supported by the experimental observations. In view of the obtained results we also discuss the reproducibility of NC-AFM imaging.",
author = "J. Bamidele and Li, {Y. J.} and S. Jarvis and Y. Naitoh and Y. Sugawara and L. Kantorovich",
year = "2012",
month = dec,
day = "1",
doi = "10.1039/c2cp43121a",
language = "English",
volume = "14",
journal = "Physical Chemistry Chemical Physics",
issn = "1463-9076",
publisher = "Royal Society of Chemistry",
number = "47",

}

RIS

TY - JOUR

T1 - Complex design of dissipation signals in non-contact atomic force microscopy

AU - Bamidele, J.

AU - Li, Y. J.

AU - Jarvis, S.

AU - Naitoh, Y.

AU - Sugawara, Y.

AU - Kantorovich, L.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Complex interplay between topography and dissipation signals in Non-Contact Atomic Force Microscopy (NC-AFM) is studied by a combination of state-of-the-art theory and experiment applied to the Si(001) surface prone to instabilities. Considering a wide range of tip-sample separations down to the near-contact regime and several tip models, both stiff and more flexible, a sophisticated architecture of hysteresis loops in the simulated tip force-distance curves is revealed. At small tip-surface distances the dissipation was found to be comprised of two related contributions due to both the surface and tip. These are accompanied by the corresponding surface and tip distortion approach-retraction dynamics. Qualitative conclusions drawn from the theoretical simulations such as large dissipation signals (textgreater1.0 eV) and a step-like dissipation dependent on the tip-surface distance are broadly supported by the experimental observations. In view of the obtained results we also discuss the reproducibility of NC-AFM imaging.

AB - Complex interplay between topography and dissipation signals in Non-Contact Atomic Force Microscopy (NC-AFM) is studied by a combination of state-of-the-art theory and experiment applied to the Si(001) surface prone to instabilities. Considering a wide range of tip-sample separations down to the near-contact regime and several tip models, both stiff and more flexible, a sophisticated architecture of hysteresis loops in the simulated tip force-distance curves is revealed. At small tip-surface distances the dissipation was found to be comprised of two related contributions due to both the surface and tip. These are accompanied by the corresponding surface and tip distortion approach-retraction dynamics. Qualitative conclusions drawn from the theoretical simulations such as large dissipation signals (textgreater1.0 eV) and a step-like dissipation dependent on the tip-surface distance are broadly supported by the experimental observations. In view of the obtained results we also discuss the reproducibility of NC-AFM imaging.

U2 - 10.1039/c2cp43121a

DO - 10.1039/c2cp43121a

M3 - Journal article

VL - 14

JO - Physical Chemistry Chemical Physics

JF - Physical Chemistry Chemical Physics

SN - 1463-9076

IS - 47

M1 - 16250

ER -