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DC bias circuit effects in CV measurements.

Research output: Contribution to conference - Without ISBN/ISSN › Speech

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DC bias circuit effects in CV measurements. / Chilingarov, Alexandre.
2006. 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, CERN, Geneva, Switzerland.

Research output: Contribution to conference - Without ISBN/ISSN › Speech

Harvard

Chilingarov, A 2006, 'DC bias circuit effects in CV measurements.', 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, CERN, Geneva, Switzerland, 16/10/06 - 18/10/06. <http://rd50.web.cern.ch/rd50/9th-workshop/default.htm>

APA

Chilingarov, A. (2006). DC bias circuit effects in CV measurements.. 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, CERN, Geneva, Switzerland. http://rd50.web.cern.ch/rd50/9th-workshop/default.htm

Vancouver

Chilingarov A. DC bias circuit effects in CV measurements.. 2006. 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, CERN, Geneva, Switzerland.

Author

Chilingarov, Alexandre. / DC bias circuit effects in CV measurements. 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, CERN, Geneva, Switzerland.23 p.

Bibtex

@conference{b8b7ee1b379543aaad295726a84699c4,
title = "DC bias circuit effects in CV measurements.",
abstract = "A DC bias circuit is a necessary part of CV measurement set-up. The effects of this circuit on the measured parameters are simulated and compared with experimental data. Reconstruction of the actual DUT characteristics is considered.",
author = "Alexandre Chilingarov",
year = "2006",
month = oct,
day = "16",
language = "English",
note = "9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders ; Conference date: 16-10-2006 Through 18-10-2006",

}

RIS

TY - CONF

T1 - DC bias circuit effects in CV measurements.

AU - Chilingarov, Alexandre

PY - 2006/10/16

Y1 - 2006/10/16

N2 - A DC bias circuit is a necessary part of CV measurement set-up. The effects of this circuit on the measured parameters are simulated and compared with experimental data. Reconstruction of the actual DUT characteristics is considered.

AB - A DC bias circuit is a necessary part of CV measurement set-up. The effects of this circuit on the measured parameters are simulated and compared with experimental data. Reconstruction of the actual DUT characteristics is considered.

M3 - Speech

T2 - 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders

Y2 - 16 October 2006 through 18 October 2006

ER -