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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. / Berden, G.; Jamison, S.P.; MacLeod, A.M. et al.
In: Physical review letters, Vol. 93, No. 11, 114802, 09.09.2004.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Berden, G, Jamison, SP, MacLeod, AM, Gillespie, WA, Redlich, B & Van der Meer, AFG 2004, 'Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles', Physical review letters, vol. 93, no. 11, 114802. https://doi.org/10.1103/PhysRevLett.93.114802

APA

Berden, G., Jamison, S. P., MacLeod, A. M., Gillespie, W. A., Redlich, B., & Van der Meer, A. F. G. (2004). Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. Physical review letters, 93(11), Article 114802. https://doi.org/10.1103/PhysRevLett.93.114802

Vancouver

Berden G, Jamison SP, MacLeod AM, Gillespie WA, Redlich B, Van der Meer AFG. Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. Physical review letters. 2004 Sept 9;93(11):114802. doi: 10.1103/PhysRevLett.93.114802

Author

Berden, G. ; Jamison, S.P. ; MacLeod, A.M. et al. / Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. In: Physical review letters. 2004 ; Vol. 93, No. 11.

Bibtex

@article{b5d4313d86294a4cb44a303a16c8dc92,
title = "Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles",
abstract = "Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.",
author = "G. Berden and S.P. Jamison and A.M. MacLeod and W.A. Gillespie and B. Redlich and {Van der Meer}, A.F.G.",
year = "2004",
month = sep,
day = "9",
doi = "10.1103/PhysRevLett.93.114802",
language = "English",
volume = "93",
journal = "Physical review letters",
issn = "1079-7114",
publisher = "American Physical Society",
number = "11",

}

RIS

TY - JOUR

T1 - Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

AU - Berden, G.

AU - Jamison, S.P.

AU - MacLeod, A.M.

AU - Gillespie, W.A.

AU - Redlich, B.

AU - Van der Meer, A.F.G.

PY - 2004/9/9

Y1 - 2004/9/9

N2 - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.

AB - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.

U2 - 10.1103/PhysRevLett.93.114802

DO - 10.1103/PhysRevLett.93.114802

M3 - Journal article

VL - 93

JO - Physical review letters

JF - Physical review letters

SN - 1079-7114

IS - 11

M1 - 114802

ER -