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Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

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Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. / Steffen, B.; Arsov, V.; Berden, G. et al.
In: Physical Review Special Topics: Accelerators and Beams, Vol. 12, No. 3, 032802, 17.03.2009.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Steffen, B, Arsov, V, Berden, G, Gillespie, WA, Jamison, SP, MacLeod, AM, Van Der Meer, AFG, Phillips, PJ, Schlarb, H, Schmidt, B & Schmüser, P 2009, 'Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH', Physical Review Special Topics: Accelerators and Beams, vol. 12, no. 3, 032802. https://doi.org/10.1103/PhysRevSTAB.12.032802

APA

Steffen, B., Arsov, V., Berden, G., Gillespie, W. A., Jamison, S. P., MacLeod, A. M., Van Der Meer, A. F. G., Phillips, P. J., Schlarb, H., Schmidt, B., & Schmüser, P. (2009). Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics: Accelerators and Beams, 12(3), Article 032802. https://doi.org/10.1103/PhysRevSTAB.12.032802

Vancouver

Steffen B, Arsov V, Berden G, Gillespie WA, Jamison SP, MacLeod AM et al. Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics: Accelerators and Beams. 2009 Mar 17;12(3):032802. doi: 10.1103/PhysRevSTAB.12.032802

Author

Steffen, B. ; Arsov, V. ; Berden, G. et al. / Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. In: Physical Review Special Topics: Accelerators and Beams. 2009 ; Vol. 12, No. 3.

Bibtex

@article{cccedf6e4f764582aecaf69c51cf3f06,
title = "Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH",
abstract = "Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.",
author = "B. Steffen and V. Arsov and G. Berden and W.A. Gillespie and S.P. Jamison and A.M. MacLeod and {Van Der Meer}, A.F.G. and P.J. Phillips and H. Schlarb and B. Schmidt and P. Schm{\"u}ser",
year = "2009",
month = mar,
day = "17",
doi = "10.1103/PhysRevSTAB.12.032802",
language = "English",
volume = "12",
journal = "Physical Review Special Topics: Accelerators and Beams",
issn = "1098-4402",
publisher = "AMER PHYSICAL SOC",
number = "3",

}

RIS

TY - JOUR

T1 - Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

AU - Steffen, B.

AU - Arsov, V.

AU - Berden, G.

AU - Gillespie, W.A.

AU - Jamison, S.P.

AU - MacLeod, A.M.

AU - Van Der Meer, A.F.G.

AU - Phillips, P.J.

AU - Schlarb, H.

AU - Schmidt, B.

AU - Schmüser, P.

PY - 2009/3/17

Y1 - 2009/3/17

N2 - Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

AB - Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

U2 - 10.1103/PhysRevSTAB.12.032802

DO - 10.1103/PhysRevSTAB.12.032802

M3 - Journal article

VL - 12

JO - Physical Review Special Topics: Accelerators and Beams

JF - Physical Review Special Topics: Accelerators and Beams

SN - 1098-4402

IS - 3

M1 - 032802

ER -