Rights statement: © 2013 American Physical Society
Final published version, 443 KB, PDF document
Available under license: CC BY: Creative Commons Attribution 4.0 International License
Final published version
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Evidence for the role of normal-state electrons in nanoelectromechanical damping mechanisms at very low temperatures
AU - Lulla, K. J.
AU - Defoort, M.
AU - Blanc, C.
AU - Bourgeois, O.
AU - Collin, E.
N1 - © 2013 American Physical Society
PY - 2013/4/25
Y1 - 2013/4/25
N2 - We report on experiments performed at low temperatures on aluminum covered silicon nanoelectromechanical resonators. The substantial difference observed between the mechanical dissipation in the normal and superconducting states measured within the same device unambiguously demonstrates the importance of normal-state electrons in the damping mechanism. The dissipative component becomes vanishingly small at very low temperatures in the superconducting state, leading to exceptional values for the quality factor of such small silicon structures. A critical discussion is given within the framework of the standard tunneling model.
AB - We report on experiments performed at low temperatures on aluminum covered silicon nanoelectromechanical resonators. The substantial difference observed between the mechanical dissipation in the normal and superconducting states measured within the same device unambiguously demonstrates the importance of normal-state electrons in the damping mechanism. The dissipative component becomes vanishingly small at very low temperatures in the superconducting state, leading to exceptional values for the quality factor of such small silicon structures. A critical discussion is given within the framework of the standard tunneling model.
KW - cond-mat.mes-hall
U2 - 10.1103/PhysRevLett.110.177206
DO - 10.1103/PhysRevLett.110.177206
M3 - Journal article
VL - 110
JO - Physical review letters
JF - Physical review letters
SN - 1079-7114
IS - 17
M1 - 177206
ER -