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Excess quantum noise due to mode non-orthogonality in dielectric microresonators.

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Excess quantum noise due to mode non-orthogonality in dielectric microresonators. / Schomerus, Henning.
In: Physical review a, Vol. 79, No. 6, 12.06.2009, p. 061801(R).

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Schomerus, H 2009, 'Excess quantum noise due to mode non-orthogonality in dielectric microresonators.', Physical review a, vol. 79, no. 6, pp. 061801(R). https://doi.org/10.1103/PhysRevA.79.061801

APA

Schomerus, H. (2009). Excess quantum noise due to mode non-orthogonality in dielectric microresonators. Physical review a, 79(6), 061801(R). https://doi.org/10.1103/PhysRevA.79.061801

Vancouver

Schomerus H. Excess quantum noise due to mode non-orthogonality in dielectric microresonators. Physical review a. 2009 Jun 12;79(6):061801(R). doi: 10.1103/PhysRevA.79.061801

Author

Schomerus, Henning. / Excess quantum noise due to mode non-orthogonality in dielectric microresonators. In: Physical review a. 2009 ; Vol. 79, No. 6. pp. 061801(R).

Bibtex

@article{d7b49589ace646c0b628b29238682974,
title = "Excess quantum noise due to mode non-orthogonality in dielectric microresonators.",
abstract = "This work presents a theory of the frequency-resolved light emission of active two-dimensional dielectric microresonators, which are characterized by a highly nonparaxial mode structure and frequently feature a position-dependent dielectric constant and nonuniform gain. The Lorentzian intensity profile is characterized by an appropriately generalized Petermann factor, a renormalized peak position, and the cold-cavity resonance lifetime Gamma. The theory also delivers a relation of Gamma to the laser threshold that improves earlier phenomenological expressions even for the case of a homogeneous medium.",
author = "Henning Schomerus",
note = "{\textcopyright}2009 The American Physical Society",
year = "2009",
month = jun,
day = "12",
doi = "10.1103/PhysRevA.79.061801",
language = "English",
volume = "79",
pages = "061801(R)",
journal = "Physical review a",
issn = "1050-2947",
publisher = "American Physical Society",
number = "6",

}

RIS

TY - JOUR

T1 - Excess quantum noise due to mode non-orthogonality in dielectric microresonators.

AU - Schomerus, Henning

N1 - ©2009 The American Physical Society

PY - 2009/6/12

Y1 - 2009/6/12

N2 - This work presents a theory of the frequency-resolved light emission of active two-dimensional dielectric microresonators, which are characterized by a highly nonparaxial mode structure and frequently feature a position-dependent dielectric constant and nonuniform gain. The Lorentzian intensity profile is characterized by an appropriately generalized Petermann factor, a renormalized peak position, and the cold-cavity resonance lifetime Gamma. The theory also delivers a relation of Gamma to the laser threshold that improves earlier phenomenological expressions even for the case of a homogeneous medium.

AB - This work presents a theory of the frequency-resolved light emission of active two-dimensional dielectric microresonators, which are characterized by a highly nonparaxial mode structure and frequently feature a position-dependent dielectric constant and nonuniform gain. The Lorentzian intensity profile is characterized by an appropriately generalized Petermann factor, a renormalized peak position, and the cold-cavity resonance lifetime Gamma. The theory also delivers a relation of Gamma to the laser threshold that improves earlier phenomenological expressions even for the case of a homogeneous medium.

U2 - 10.1103/PhysRevA.79.061801

DO - 10.1103/PhysRevA.79.061801

M3 - Journal article

VL - 79

SP - 061801(R)

JO - Physical review a

JF - Physical review a

SN - 1050-2947

IS - 6

ER -