Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Exponential sensitivity to dephasing of electrical conduction through a quantum dot.
AU - Tworzydlo, J.
AU - Tajic, A.
AU - Schomerus, H.
AU - Brouwer, P. W.
AU - Beenakker, C. W. J.
PY - 2004
Y1 - 2004
N2 - According to random-matrix theory, interference effects in the conductance of a ballistic chaotic quantum dot should vanish propto(tau_phi/tau_D)^p when the dephasing time tau_phi becomes small compared to the mean dwell time tau_D. Aleiner and Larkin have predicted that the power law crosses over to an exponential suppression exp(�tau_E/tau_phi) when tau_phi drops below the Ehrenfest time tau_E. We report the first observation of this crossover in a computer simulation of universal conductance fluctuations. Their theory also predicts an exponential suppression propto exp(�tau_E/tau_D) in the absence of dephasing�which is not observed. We show that the effective random-matrix theory proposed previously for quantum dots without dephasing explains both observations.
AB - According to random-matrix theory, interference effects in the conductance of a ballistic chaotic quantum dot should vanish propto(tau_phi/tau_D)^p when the dephasing time tau_phi becomes small compared to the mean dwell time tau_D. Aleiner and Larkin have predicted that the power law crosses over to an exponential suppression exp(�tau_E/tau_phi) when tau_phi drops below the Ehrenfest time tau_E. We report the first observation of this crossover in a computer simulation of universal conductance fluctuations. Their theory also predicts an exponential suppression propto exp(�tau_E/tau_D) in the absence of dephasing�which is not observed. We show that the effective random-matrix theory proposed previously for quantum dots without dephasing explains both observations.
U2 - 10.1103/PhysRevLett.93.186806
DO - 10.1103/PhysRevLett.93.186806
M3 - Journal article
VL - 93
SP - 186806
JO - Physical review letters
JF - Physical review letters
ER -