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Foreword to "Using Imperfect Semiconductor Systems for Unique Identification"

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNForeword/postscript

Publication date1/12/2017
Host publicationUsing Imperfect Semiconductor Systems for Unique Identification
Place of PublicationCham
Number of pages2
ISBN (Electronic)9783319678917
ISBN (Print)9783319678900
<mark>Original language</mark>English

Publication series

NameSpringer Theses
ISSN (Print)2190-5053
ISSN (Electronic)2190-5061


This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.
Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.