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Foreword to "Using Imperfect Semiconductor Systems for Unique Identification"

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Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". / Young, Robert James; Roberts, Jonny (Editor).

Using Imperfect Semiconductor Systems for Unique Identification. Cham : Springer, 2017. (Springer Theses).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNForeword/postscript

Harvard

Young, RJ & Roberts, J (ed.) 2017, Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". in Using Imperfect Semiconductor Systems for Unique Identification. Springer Theses, Springer, Cham. https://doi.org/10.1007/978-3-319-67891-7

APA

Young, R. J., & Roberts, J. (Ed.) (2017). Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". In Using Imperfect Semiconductor Systems for Unique Identification (Springer Theses). Springer. https://doi.org/10.1007/978-3-319-67891-7

Vancouver

Young RJ, Roberts J, (ed.). Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". In Using Imperfect Semiconductor Systems for Unique Identification. Cham: Springer. 2017. (Springer Theses). https://doi.org/10.1007/978-3-319-67891-7

Author

Young, Robert James ; Roberts, Jonny (Editor). / Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". Using Imperfect Semiconductor Systems for Unique Identification. Cham : Springer, 2017. (Springer Theses).

Bibtex

@inbook{df206d3024044c43b04bae22b9a1ee93,
title = "Foreword to {"}Using Imperfect Semiconductor Systems for Unique Identification{"}",
abstract = "This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.",
author = "Young, {Robert James} and Jonny Roberts",
year = "2017",
month = dec,
day = "1",
doi = "10.1007/978-3-319-67891-7",
language = "English",
isbn = "9783319678900",
series = "Springer Theses",
publisher = "Springer",
booktitle = "Using Imperfect Semiconductor Systems for Unique Identification",

}

RIS

TY - CHAP

T1 - Foreword to "Using Imperfect Semiconductor Systems for Unique Identification"

AU - Young, Robert James

A2 - Roberts, Jonny

PY - 2017/12/1

Y1 - 2017/12/1

N2 - This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.

AB - This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.

U2 - 10.1007/978-3-319-67891-7

DO - 10.1007/978-3-319-67891-7

M3 - Foreword/postscript

SN - 9783319678900

T3 - Springer Theses

BT - Using Imperfect Semiconductor Systems for Unique Identification

PB - Springer

CY - Cham

ER -