Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
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TY - GEN
T1 - High gain InAs electron-avalanche photodiodes for optical communication
AU - Marshall, A. R. J.
AU - Vines, P.
AU - Xie, S.
AU - David, J. P. R.
AU - Tan, C. H.
PY - 2010
Y1 - 2010
N2 - We report the avalanche properties of InAs avalanche photodiodes (APDs), extracted from avalanche gain and excess noise measurements performed under pure electron and pure hole injections, and from Monte Carlo simulations. For a given avalanche width electron initiated gain was found to be significantly higher than conventional InP and Si APDs. Hole initiated multiplication was negligible confirming the electron only multiplication process within the field range covered. Excess noise measurements showed the excess noise factors of less than 2, providing further evidence of the ideal avalanche properties in InAs. Monte Carlo simulations performed provided good agreement to experimental results.
AB - We report the avalanche properties of InAs avalanche photodiodes (APDs), extracted from avalanche gain and excess noise measurements performed under pure electron and pure hole injections, and from Monte Carlo simulations. For a given avalanche width electron initiated gain was found to be significantly higher than conventional InP and Si APDs. Hole initiated multiplication was negligible confirming the electron only multiplication process within the field range covered. Excess noise measurements showed the excess noise factors of less than 2, providing further evidence of the ideal avalanche properties in InAs. Monte Carlo simulations performed provided good agreement to experimental results.
U2 - 10.1109/ICIPRM.2010.5516221
DO - 10.1109/ICIPRM.2010.5516221
M3 - Conference contribution/Paper
SN - 978-1-4244-5920-9
SP - -
BT - 2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM)
PB - IEEE
CY - New York
T2 - 22nd International Conference on Indium Phosphide and Related Materials
Y2 - 31 May 2010 through 4 June 2010
ER -